Radiation Qualification by Means of the System-Level Testing: Opportunities and Limitations

Tomasz Rajkowski,Frédéric Saigné,Pierre-Xiao Wang
DOI: https://doi.org/10.3390/electronics11030378
IF: 2.9
2022-01-27
Electronics
Abstract:System-level radiation testing of electronics is evaluated, based on test examples of the System-in-Package (SiP) module irradiations. Total ionizing dose and single event effects tests are analyzed to better understand the opportunities and limitations of the system-level approach in the context of the radiation qualification of electronics. Impact on the SiP product development is discussed.
engineering, electrical & electronic,computer science, information systems,physics, applied
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