Photoreflectance: A Poor Man’s Approach to Non-Linear Spectroscopy

Dan Birkedal
DOI: https://doi.org/10.1007/978-1-4899-1190-2_39
1994-01-01
Abstract:Photoreflectance (PR) have proven to be a valuable tool for characterizing of semiconductor structures. As a modulated measurement PR is an inherent non-linear technique, even though low excitation powers are used. In this presentation a description of the experimental technique is given and the fundamental modulation mechanism is discussed. We show how the Franz-Keldysh effect give rise for oscillations in the PR-spectrum. PR- spectra of ∂-doped GaAs structures are presented and the interpretation of these spectra is discussed.
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