Abstract:<p>Acceptance sampling plan establishes a required sample size for lot inspection and decisive capability criteria for lot dispositions. The multiple-lot dependent state (MDS) and the generalized MDS (GMDS) plans have been recently developed for operating capability-qualified compliance testing of a process with a one-sided specification in continuous submissions. However, both lot-dependent plans are incapable for sustaining a long-lasting supplier-buyer relationship. The MDS plan's benefits deteriorate as the number of deliberated anteceding lot-sentencing outcomes increases; the GMDS plan may suffer a schematic problem in some cases where the current lot having marginal capability will be accepted with an inferior capability history. To remedy those shortcomings, an adjustable MDS (AMDS) sampling plan on qualifying the process capability with a one-sided specification is constructed. This AMDS plan not only allows more backtracking lots encompassed in the lot-disposition decision but also substantially improves the inspection efficiency regarding the required sample size and lot-discriminatory power. More importantly, the plan, operating for the long-run inspection, exhibits a consistent upward-trend phenomenon for the required acceptance-capability standard, which firmly advocates the sustainability of business whose suppliers show continuous improvement of process capability. Finally, the industrial applicability of AMDS is illustrated in a case study.</p>

Developing a variables modified chain sampling plan with Taguchi capability index

Developing a variables multiple dependent state sampling plan with simultaneous consideration of process yield and quality loss

Developing a skip-lot sampling scheme by variables inspection using repetitive sampling as a reference plan

Optimal designing of skip-lot sampling plan with a provision for reducing the normal inspection using the Taguchi process capability index

An improved skip-lot sampling scheme with resampling mechanism using an advanced capability index

Developing a sampling plan by variables inspection for controlling lot fraction of defectives

Design and construction of a variables quick switching sampling system based on Taguchi capability index

Designing of Variables Modified Chain Sampling Plan Based on the Process Capability Index with Unknown Mean and Variance

A variable-type skip-lot sampling plan for products with a unilateral specification limit

Modified chain sampling plans for lot inspection by variables and attributes

Optimal designing of a new mixed variable lot-size chain sampling plan based on the process capability index

Attribute Sampling Plan for Submitted Lots Based on Prior Information and Bayesian Approach

An adjustable inspection scheme for lot sentencing based on one-sided capability indices

Process‐capability‐qualified adjustable multiple‐dependent‐state sampling plan for a long‐term supplier–buyer relationship

Designing of a mixed-chain sampling plan based on the process capability index with chain sampling as the attributes plan

A new approach of chain sampling inspection plan

Chain sampling plan (ChSP-1) for desired acceptable quality level (AQL) and limiting quality level (LQL)

Variables sampling plans with PPM fraction of defectives and process loss consideration

Stage-independent multiple sampling plan by variables inspection for lot determination based on the process capability index Cpk

Proposal of variable sequential sampling plan having desired operating characteristics indexed by quality loss

Lot-dependent sampling plans for qualifying long-term production capability with a one-sided specification