Abstract:<span>Reducing the warranty cost to increase profit is a major focus for most businesses. To achieve this goal, the acceptance sampling plan (ASP) can be an efficient tool to validate whether the product lifetimes meet their requirements. In the ASP practice, the single sampling plan (SSP) is widely used due to its administrative simplicity. Unfortunately, the SSP ignores the valuable sample information from preceding lots, which may reduce its efficiency and quality-discrimination power. Especially, the collection of lifetime information often consumes a significant amount of time and is expensive in today's high product-yield and long-life environment. To address the drawbacks of the SSP, we propose a lifetime performance-qualified quick switch sampling (QSS) system under a Weibull distribution with failure-censoring. This system nimbly switches between the normal SSP and tightened SSP based on the previous lot-disposition result. Compared to the ordinary SSP and the recently proposed multiple-lot dependent sampling plan, the QSS system not only significantly reduces the required number of failures that need to be observed in the life testing but also exhibits a better discriminatory operating characteristic curve for the lot disposition. On the other hand, the QSS system helps the consumer to communicate to the supplier important messages that (i) only with reliable submissions the latter can persistently enjoy the benefits of the normal lot-sentencing standard; (ii) once the submitted lot is rejected, the supplier will have to spend more efforts to gain back the consumer trust. Moreover, we developed a web-based tool to help practitioners obtain the system criteria easily and quickly without the need for the traditional time-consuming table lookup. By operating the interactive interface of the web app, practitioners can quickly obtain the system criteria conforming to the requirements. Finally, the proposed QSS system is illustrated by a real-life application.</span>

Proposal of variable sequential sampling plan having desired operating characteristics indexed by quality loss

Variables sampling plans with PPM fraction of defectives and process loss consideration

Design and construction of a variables quick switching sampling system based on Taguchi capability index

Optimal designing of skip-lot sampling plan with a provision for reducing the normal inspection using the Taguchi process capability index

Developing a sampling plan by variables inspection for controlling lot fraction of defectives

A variable-type skip-lot sampling plan for products with a unilateral specification limit

Developing a variables multiple dependent state sampling plan with simultaneous consideration of process yield and quality loss

The integrated application of acceptance sampling in the quality control of manufacturing process and quality assurance of shipment product

Developing a skip-lot sampling scheme by variables inspection using repetitive sampling as a reference plan

Developing a variables modified chain sampling plan with Taguchi capability index

Designing of Variables Modified Chain Sampling Plan Based on the Process Capability Index with Unknown Mean and Variance

An adjustable inspection scheme for lot sentencing based on one-sided capability indices

A variables-type multiple-dependent-state sampling plan based on the lifetime performance index under a Weibull distribution

Lifetime performance-qualified sampling system under a Weibull distribution with failure-censoring

Analysis of two stage sampling plan with imperfect inspection

Lot-dependent sampling plans for qualifying long-term production capability with a one-sided specification

An improved skip-lot sampling scheme with resampling mechanism using an advanced capability index

Mixed Acceptance Sampling Plans for Product Inspection Using Process Capability Index

Attribute Sampling Plan for Submitted Lots Based on Prior Information and Bayesian Approach

Sampling for quality inspection and correction: AOQL performance criteria

A Robust Tolerance Design Method Based on Fuzzy Quality Loss