Developing a skip-lot sampling scheme by variables inspection using repetitive sampling as a reference plan

Chien-Wei Wu,Amy H. I. Lee,Yi-San Huang

DOI: https://doi.org/10.1080/00207543.2021.1909768

IF: 9.018

2021-04-13

International Journal of Production Research

Abstract:<span>In today's manufacturing environment, the rate of defective products has been continuously decreasing; thus, variables sampling plans with process capability indices (PCIs) have been recommended to gather more information about a manufacturing process and reduce required sample sizes for inspection. In particular, skip-lot sampling plan (SkSP) is suitable for a series of lots having stable and excellent product quality. Moreover, the concept of repetitive group sampling (RGS), which can allow the use of less samples to maintain desired protection to producers and consumers, is especially appropriate where inspection or testing is costly or destructive. This study, by incorporating the advantages of PCIs, SkSP, and RGS, constructs a variables SkSP with RGS as the reference plan (called SkSP-RGS) based on one-sided PCIs for products with a unilateral specification limit. The proposed plan reduces the sample size while achieving a similar discriminatory power, compared with a conventional variables single sampling plan (SSP), a RGS plan (RGSP), and a SkSP of type 2 (SkSP-2). Tables of plan parameters are provided for frequently applied quality and risk requirements so that practitioners can easily apply the proposed plan.</span>

engineering, manufacturing, industrial,operations research & management science

What problem does this paper attempt to address?

### Problems the Paper Aims to Solve

The paper aims to address the issue of how to improve inspection efficiency in modern manufacturing environments. Specifically, the goal of the paper is to reduce the number of inspection samples while ensuring product quality. The authors achieve this goal by integrating the advantages of the following three aspects:

1. **Process Capability Indices (PCI)**: Used to assess the capability and quality of the manufacturing process.
2. **Skip-Lot Sampling Plan (SkSP)**: Suitable for products with stable and excellent quality in continuous batches.
3. **Repetitive Group Sampling Plan (RGSP)**: Can be used with fewer samples in cases of high-cost or destructive inspections.

Based on the above three aspects, the authors developed a new variable skip-lot sampling plan (SkSP-RGS), which is based on process capability indices (PCI) under unilateral specification limits. This plan significantly reduces the required sample size while ensuring protection for both producers and consumers, thereby improving inspection efficiency.

### Specific Problem Description

- **Background**: With the development of manufacturing technology, the defect rate of products continues to decline, making traditional sampling inspection methods no longer applicable.
- **Objective**: To develop a new sampling plan that can reduce the sample size while maintaining similar discriminative power.
- **Method**: Combine the advantages of process capability indices, skip-lot sampling plans, and repetitive group sampling plans to construct a variable skip-lot sampling plan (SkSP-RGS).
- **Results**: The new plan can significantly reduce the sample size and provide discriminative power similar to traditional single sample sampling plans (SSP), repetitive group sampling plans (RGSP), and type 2 skip-lot sampling plans (SkSP-2).