Abstract:In this paper, we analyze the impact of characteristic impedance variations among standards on the accuracy of the thru-reflect-line (TRL) calibration technique. The impedance transformer method is adopted to derive the expressions of the calibration coefficient errors due to the manufacturing tolerances. It is found that three factors can affect the magnitude of the errors in the calibration coefficients (c/a and b terms), which are crucial to get the final calibrated results. The first factor is related to the original parameters of the error networks (test fixtures): the larger the insertion losses, the smaller the error in b; the error in c/a may see an opposite trend if the error network is lossy instead of lossless. The second factor is denoted as the phase contribution (one of the three multipliers of the derived error expression): the magnitude of this error contributing item is approximately equal to the ratio of two hyperbolic sine functions, the variables of which are the length of Line and the length difference between Line and Thru, respectively. The third factor comes from the impedance differences between Thru and Line: the smaller the impedance variation, the smaller the error. The error analysis, presented here, can help engineers evaluate the calibration accuracy by analyzing the error contributing items. It also can be further used to guide test fixture designs to maximize TRL's error immunity to the transmission line characteristic impedance variations.

A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

A Novel Reformulation of LNN Calibration Algorithm

Divisionally Analytical Solutions of Laplace'S Equations for Dry Calibration of Electromagnetic Velocity Probes

An Improved Line-Reflect-Reflect-Match Calibration With an Enhanced Load Model

An enhanced Line-Reflect-Reflect-Match calibration

MMIC on-Wafer Test Method Based on Hybrid Balanced and Unbalanced RF Pad Structures

A Thru-free Multiline Calibration

A calibration method for vector network analyzers using a line and three or more offset-reflect standards

A Method to Determine LRRM Calibration Standards in Measurement Configurations Affected by Leakage

Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy

Calibrate the Non-Orthogonal Error of AFM with Two-Dimensional Self-Traceable Grating.

A hybrid probe-tip calibration for multiport vector network analyzers

Symmetric-Reciprocal-Match Method for Vector Network Analyzer Calibration

A Novel Four-Port Symmetric Probe Calibration Method for On-Wafer S-Parameter Measurement

Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration

An Ultrawideband Asymmetric Calibration Method for a Simultaneously Electromagnetic Near-Field Probing System

Thru-Reflect-Line Calibration Technique: Error Analysis for Characteristic Impedance Variations in the Line Standards

2-Port GSG Probe Calibration Using TRL and 16-Term Error Model Up to 100Ghz

An efficient testing system and calibration method for a reflection type vector modulator