Microstructural characterization, electrical, and optical study of V2O5-doped Cr2O3 films for photonic applications
Adel M. El Sayed,Faisal Katib Alanazi
DOI: https://doi.org/10.1007/s10854-024-13869-7
2024-11-28
Journal of Materials Science Materials in Electronics
Abstract:The performance and optoelectronic properties of the transition metal (TM) oxide thin films can be enhanced by doping with other materials. In this study, V 2 O 5 nanoparticles (NPs) were prepared by sol–gel and then used to prepare V 2 O 5 -doped Cr 2 O 3 thin films using the spin-coating technique. The microstructural, morphological characterization, I–V measurements, and optical properties of the films were investigated. The XRD, FE-SEM, EDAX, and FTIR measurements revealed the polycrystalline nature, granular morphology, reduction in particle size (from 43 ± 2.58 nm to 21 ± 1.25 nm), crystallinity deterioration, and the limited stretching vibrations of Cr–O and Cr–O–Cr upon inclusion of V 2 O 5 . The doping didn't alter the rhomoboedric corundum structure of Cr 2 O 3 . The films exhibited linear I–V behavior and their resistance decreased with doping. The films are highly transparent (up to 88%), and their absorption was minimal in the visible region. A new figure of merit was in the range of 0.255–0.270. The refractive index has bell-shaped behavior with the wavelength and increased with increasing V 2 O 5 . Additionally, the optical band gap ( E g ) of the films decreased from 3.0 to 2.5 eV. The influences of 0.5–5.0% V 2 O 5 doping ratio on the grain size, dislocation density, microstrain, and charge carrier concentration were investigated. The finding of this study indicates that the optoelectronic features of V 2 O 5 -doped Cr 2 O 3 films were improved and the films can be used for various optoelectronic and photonic devices.
engineering, electrical & electronic,materials science, multidisciplinary,physics, condensed matter, applied