Design and Analysis of GaN-Based Parallel Flyback Circuit

Zhang Weiping,Duan Yadong,Mao Peng
DOI: https://doi.org/10.1109/eltech.2019.8839550
2019-05-01
Abstract:The effects of parasitic inductance and junction temperature on the performance of GaN parallel circuits are analyzed. Firstly, the influence of parasitic inductance and junction temperature is analyzed based on the theory of parallel flyback circuit, and the relationship between these factors and circuit loss is obtained. Voltage and current image of the converter. The theoretical analysis and simulation circuit results are analyzed and analyzed. The layout scheme of the circuit PCB and the control strategy of the circuit are obtained, which can better solve the delay, oscillation and imbalance of the circuit. Finally, through the designed prototype, compared with Si's circuit and different load conditions, the stability and balance performance of the circuit are compared and analyzed. The obtained layout method and control strategy can reduce the influence of parasitic inductance and junction temperature on the circuit.
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