Printed and unprinted office paper, by near-ambient pressure XPS

Dhruv Shah,Stephan Bahr,Paul Dietrich,Michael Meyer,Andreas Thißen,Matthew R. Linford
DOI: https://doi.org/10.1116/1.5087893
2019-11-08
Surface Science Spectra
Abstract:Near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) is a less-traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., at ca. 2500 Pa, or even higher in some cases. With NAP-XPS, XPS can probe moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. In this submission, the authors show NAP-XPS survey spectra, and C 1<i>s</i> and O 1<i>s</i> narrow scans of two samples of paper (a white office paper and the nonsticky side of a yellow post-it note). The white office paper was analyzed at three specific positions: an unprinted portion, a light blue letter, and a dark blue letter in the "SPECS" logo. Survey spectra show the presence of carbon, oxygen, nitrogen, and calcium in all the samples. The yellow paper shows a small amount of silicon. Fits to the C 1<i>s</i> and O 1<i>s</i> regions are shown. The O 1<i>s</i> narrow scans are fit with four peaks using a literature approach previously employed for paper and with three peaks in a more <i>ad hoc</i> fashion. The latter approach yields better fits.
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