Converter-Level Reliability of Wind Turbine With Low Sample Rate Mission Profile

Dao Zhou,Frede Blaabjerg
DOI: https://doi.org/10.1109/tia.2020.2977301
IF: 4.079
2020-05-01
IEEE Transactions on Industry Applications
Abstract:The thermal dynamics of power semiconductors and power capacitors are closely related to the reliability and affect the cost of power electronic converter. However, the component loading in a wind turbine system is disturbed by many factors of the power converter, which presents various time constants from microseconds to hours. To determine the system availability in such system is a challenge and need detailed analysis. In the case of a mission profile with 1-hour sample rate, a simplified circuit model, loss model, and thermal model of the active power switches and passive capacitors are needed and described. According to the long-term electrothermal profile, the percentile lifetime of a single component can be predicted. The Weibull function based time-to-failure distribution can then be used to link from component-level to converter-level reliability. From analysis of a 2 MW wind turbine system, it can be seen that the dc-link capacitor bank dominates the converter-level reliability.
engineering, electrical & electronic, multidisciplinary
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