Converter-Level Reliability of Wind Turbine with Low Sample Rate Mission Profile

Dao Zhou,Frede Blaabjerg
DOI: https://doi.org/10.23919/icpe2019-ecceasia42246.2019.8797060
2019-05-01
Abstract:The thermal dynamics of power semiconductors and power capacitors are closely related to the reliability and the cost of power electronic converter. However, the component loading in a wind turbine system is disturbed by many factors of the converter system, which is present at various time-constants from microseconds to years. In the case of a mission profile with 1-hour sample rate, the circuit model, loss model, and thermal model of the active power switches and passive capacitors are described and presented. The percentile lifetime of a single component can be predicted according to the long-term electro-thermal profile, and the Weibull function based time-to-failure distribution of the active component and passive component can be obtained. In a 2 MW wind turbine system, it can be seen that the dc-link capacitor bank dominates the converter-level reliability.
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