Reliability Analysis of Power Components in Restructured DC/DC Converters

M. Jagabar Sathik,J. Divya Navamani,A. Lavanya,Yongheng Yang,Dhafer Almakhles,Frede Blaabjerg

DOI: https://doi.org/10.1109/tdmr.2021.3116941

IF: 1.886

2021-01-01

IEEE Transactions on Device and Materials Reliability

Abstract:This paper presents a generalized restructured topology for boost, buck-boost and its derived dc/dc converters with rearranging branches to enhance the reliability of the converter. This paper instigates the derivation of state-of-the-art topologies with reduced capacitor voltage stress. Mainly in the restructured topology, the capacitor branch is rearranged in the converter and this redesign venture results in profuse advantages like a better choice of the capacitor with low voltage rating, low equivalent series resistance and reduced voltage stress of the converter. The investigation of the capacitor voltage stress and reliability test is carried out. No extra components are required in this method, the same component count as the conventional converter is maintained. In comparison with the conventional converters, the restructured topology shows the identical output voltage with decreased capacitor voltage stress. Besides reduced voltage stress, the capacitor losses are also less and this allows the capacitor to perform better. As a consequence, the efficiency and lifetime are improved and extended. A detailed illustration of the significance of this restructured concept is presented with a validating analysis. Experimental results from a 600 W prototype are presented with different duty cycles for validating and highlighting the special features of the restructured topology.