Color Spectroscopy for Energy-Level Analysis of Single-Crystal Silicon Carbide

Hyoungseuk Choi,Seong-Min Jeong
DOI: https://doi.org/10.1021/acs.cgd.1c01135
2022-03-15
Abstract:Color spectroscopy can measure energy levels via the transformation of ultraviolet photoluminescence (UVPL) color images into a color space in which emission energies have been indexed. It can be applied to the measurement of electronic energies in various materials that have energy-level differences in the visible range (1.65–3 eV). We demonstrate that color spectroscopy is a potentially cost-effective, simple, nondestructive, and full-field measurement of energy levels and can be applied widely, including in laboratories and on production lines. In this study, we developed a new spectroscopic technique named "color spectroscopy" and applied it to the analysis of the different polytypes of single-crystal silicon carbide. Raman and photoluminescence spectroscopic data are compared with the results of our method to verify their accuracy. We show that color spectroscopy can provide very accurate energy-level measurements and has the potential as a characterization tool in many fields.This article has not yet been cited by other publications.
chemistry, multidisciplinary,materials science,crystallography
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