Phase evolution with the film thickness in PLD-grown titanium oxides films
Jiaxin Feng,Lingling Wang,Yekai Song,Aobo Yu,Wei Li,Han Zhang,Teng Wang,Jianan Chu,Xuguang Xu,Wei Peng,Zhuojun Li,Gang Mu
DOI: https://doi.org/10.1016/j.jallcom.2020.154727
IF: 6.2
2020-08-01
Journal of Alloys and Compounds
Abstract:<p>Titanium oxides exhibit an intriguing structure-property correlation, due to the variable valence character of titanium ion. Here we report the growth and characterization of the superconducting binary Ti–O films. The films were grown by the pulsed laser deposition (PLD) technique on the α-Al<sub>2</sub>O<sub>3</sub> substrates, through ablating Ti<sub>2</sub>O<sub>3</sub>. It is found that, with the increase of the film thickness, the film reveals a phase evolution from the cubic TiO phase to the orthogonal Ti<sub>2</sub>O<sub>3</sub> phase. Meanwhile, the magnitude of resistivity and the superconducting transition temperature <span class="math"><math>Tc</math></span> of these films also show the systematic variation with the increase of the film thickness.</p>
materials science, multidisciplinary,chemistry, physical,metallurgy & metallurgical engineering