Periodic structure formation by focused electron-beam-induced deposition

T. Bret,I. Utke,C. Gaillard,P. Hoffmann
DOI: https://doi.org/10.1116/1.1800356
2004-01-01
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Abstract:Focused electron-beam-induced deposition from a copper precursor is shown to allow self-formation of periodic features when the beam is scanned at lateral speeds of the order of the vertical deposition rate. The period of the structures can be tuned by the scan speed. Simultaneous monitoring of the electron-beam-induced sample current and secondary electron signal shows in situ evidence of the phenomenon. The spatial distribution of scattered electrons and the influence of the structure geometry on the deposition yield are discussed. The growth rate decreases with increasing distance from the substrate. This is a growth reduction counterpart to the constant electron flow and induces the periodicity. A semi-empirical model is proposed. The study widens the understanding of the mechanism of focused electron-beam-induced deposition. This understanding will help with the future design of complex three-dimensional nanoarchitectures.
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