High-performance multilayer WSe2 p-type field effect transistors with Pd contacts for circuit applications

Lu Zhang,Yadong Zhang,Xiaoting Sun,Kunpeng Jia,Qingzhu Zhang,Zhenhua Wu,Huaxiang Yin
DOI: https://doi.org/10.1007/s10854-021-06274-x
2021-06-11
Abstract:WSe<sub>2</sub> is thought to be one of the best emerging p-type transition metal dichalcogenide (TMD) materials for potential low-power complementary metal oxide semiconductor (CMOS) circuit applications. However, the contact barrier and the interface quality hinder the performance of p-type field effect transistors (FETs) with WSe<sub>2</sub> films. In this work, metals with different work functions—Pd, Pt, and Ag—were systematically investigated as contacts for WSe<sub>2</sub> to decrease the contact resistances at source/drain electrodes and potentially improve transistor performance. Optimized p-type multilayer WSe<sub>2</sub> FETs with Pd contacts were successfully fabricated, and excellent electrical characteristics were obtained: a hole mobility of 36 cm<sup>2</sup>V<sup>−1</sup> s<sup>−1</sup>; a high on/off ratio, over 10<sup>6</sup>; and a record low sub-threshold swing, <i>SS</i> = 95 mV/dec, which may be attributed to the small Schottky barrier height of 295 meV between Pd and WSe<sub>2</sub>, and strong Fermi-level pinning near the top of the valence band at the interface. Finally, a full-functional CMOS inverter was also demonstrated, consisting of a p-type WSe<sub>2</sub> FET together with a normal n-type MoS<sub>2</sub> FET. This confirmed the potential of TMD FETs in future low-power CMOS digital circuit applications.
engineering, electrical & electronic,materials science, multidisciplinary,physics, condensed matter, applied
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