Abstract:The conventional surface x-ray diffraction method [1] allows us to determine atomic arrangements of crystal surfaces and interfaces.While x-ray diffraction intensities distributed within a reciprocal lattice space are usually measured with a finetooth comb using the method, an overall image of the diffraction intensity profile is difficult to get until after such lengthy and time consuming measurement is completed.We proposed x-ray reciprocal-lattice space imaging method (X-ReSI) for straightforward understanding of 1D nanostructures such as NiO nanowires [2].The X-ReSI is a single-exposure diffraction technique which records the reciprocallattice pattern of a fixed crystalline nanostructure using a 2D detector.The fundamental idea behind the method is that the reciprocal lattice of 1D or 2D structures are an array of sheets or rods, respectively.Thus the reciprocal-lattice space can be recorded for a fixed sample with a 2D x-ray detector fixed.The typical exposure time is a few seconds to a few minutes using the 3rd generation x-ray source.We applied the method to structural evaluation of Bi nanolines being 1/8 monolayers in coverage on average.The results of the application reveal that Bi nanolines embeded in Si was found to have a 2 x n superstructure having Bi dimer bonds [3].On the other hand line structures in samples capped with an amorphous Si layer and having no cap layers still remained with a non-detectable amount of the 2 x n atomic structures.Other applications are structural determination of a Bi4Ti3O12 thinfilm and in-situ observation of a Au electrode in H2SO4.

Forbidden 200 diffraction spots in silicon

Optical anisotropy and strain-induced birefringence in dislocation-free silicon single crystals

Optical Anisotropy in Dislocation-Free Silicon Single Crystals

On the origin of the additional electron diffraction spots from epitaxial (111) Si single-crystal films

Diffuse diffraction spots in RHEED patterns

The Origin of 0.78 Ev Line of the Dislocation Related Luminescence in Silicon

Optical Superoscillatory Poisson-Arago Spots

Time-resolved X-ray Reflection Phases of the Nearly Forbidden Si(222) Reflection under Laser Excitation.

Generation of over 1000 Diffraction Spots from 2D Graded Photonic Super-Crystals

Theoretical and experimental electron diffraction intensity maps for single crystal silicon from an ultrafast source

On the Origin of the 417 and 437 Nm Double-Peak Emission in Porous Si with Crystallite Sizes Smaller Than 3.0 Nm

Studies of Fesi2/Si Quantum Dot Nano-Structures by X-Ray Bragg-Surface Diffractions (Bsd)

Spectral diffuse scattering in porous silicon

Measuring Lattice Parameter of Iron Silicides Using X-Ray Bragg-surface Diffraction

Sub-Micron Imaging Of Sub-Surface Nanocrystalline Structure In Silicon

Theory and system of Forbidden Light near-field optical microscope

Vibrational Properties of Near-Surface Regions of Silicon Nanocrystallites

Pinning of Photoluminescence Peak Positions for Light-Emitting Porous Silicon: an Evidence of Quantum Size Effect.

Optical Emission from Excess Si Defect Centers in Si Nanostructures.

Generation of Non-Rayleigh Nondiffracting Speckles

Quantitative Agreement Between Dynamical Rocking Curves in Ultrafast Electron Diffraction for X-Ray Lasers.