Abstract:The symmetry breaking that is induced by initial imperfection (e.g., geometry or material inhomogeneity and out-of-plane disturbance) is a necessary condition for film buckling. However, the effect of initial imperfection on the buckling behavior is still not clear cut. Herein, given an elastic substrate-free circular film subjected to in-plane compressive stress and arbitrary initial imperfection, evolution of the deflection morphology is numerically studied and theoretically analyzed. Specifically, a two-dimensional spatial spectrum analysis is adopted to acquire the deflection morphology's dominant wavelength, which is combined with the maximum absolute deflection to characterize the deflection patterns. Before the so-called critical instability, the film under compression is found to go through a transition stage. Overall, the deflection increment in this stage is negligible except approaching the critical state. However, the dominant wavelength is found to be continuously growing (or decreasing) rather than suddenly appears upon reaching the so-called critical state, and, interestingly, such growth is found to be independent of the intensity and pattern of the initial imperfection if the same initial dominant wavelength is guaranteed. In the discussion, for both the transition and buckling stages, evolution laws of the deflection amplitude and wavelength are established analytically and found to agree well with the numerical results. This research clearly presents the actual evolution process of wrinkling morphology from linear in-plane deformation with small stable deflection to out-of-plane instability with large deflection, which deepens the cognition of instability behavior of films and provides a basis for related applications such as high-precision mechanical characterization.

Wrinkling of a stiff thin film bonded to a pre-strained, compliant substrate with finite thickness

Surface effects on the wrinkles in a stiff thin film bonded to a compliant substrate

A Consistent Finite-Strain Plate Model for Wrinkling of Stretched Anisotropic Hyperelastic Films

Mechanics of wrinkling of a thin film bonded to a compliant substrate under the influence of spatial thermal modulation

Buckling of a Stiff Thin Film on a Compliant Substrate in Large Deformation

A Finite Strain Model Predicts Oblique Wrinkles in Stretched Anisotropic Films

Wrinkling of Thin Films on a Microstructured Substrate

Mechanism of Surface Wrinkle Modulation for a Stiff Film on Compliant Substrate

Computer Simulation of Thin Film Wrinkling on Elastic Substrate

Spontaneous Wrinkling Pattern of A Constrained Thin Film Membrane

Generation of Buckling and Wrinkling in Elastic Films: the Effect of Initial Imperfection.

Wrinkle, fold, and ridge patterns of thin films attached to a compliant substrate: Direct numerical simulations involving plastic yielding

Wrinkling of Twisted Thin Films

Wrinkling Analysis in A Film Bonded to A Compressible Compliant Substrate in Large Deformation

Buckling and Post-Buckling of A Stiff Film Resting on an Elastic Graded Substrate

Wrinkling and Creasing of A Compressed Elastoplastic Film Resting on A Soft Substrate

Instabilities of Thin Films on a Compliant Substrate: Direct Numerical Simulations from Surface Wrinkling to Global Buckling

Numerical Analysis on the Wrinkling Instability of a Stiff Film Adhering to an Elastic Substrate with a Graded Coating

Effects of Tension–compression Asymmetry on the Surface Wrinkling of Film–substrate Systems

Wrinkling of a Film/substrate Bilayer with Periodic Material Properties: an Assessment of the Winkler Foundation Model

A Simply Analytic Study of Buckled Thin Films on Compliant Substrates