Abstract:The symmetry breaking that is induced by initial imperfection (e.g., geometry or material inhomogeneity and out-of-plane disturbance) is a necessary condition for film buckling. However, the effect of initial imperfection on the buckling behavior is still not clear cut. Herein, given an elastic substrate-free circular film subjected to in-plane compressive stress and arbitrary initial imperfection, evolution of the deflection morphology is numerically studied and theoretically analyzed. Specifically, a two-dimensional spatial spectrum analysis is adopted to acquire the deflection morphology's dominant wavelength, which is combined with the maximum absolute deflection to characterize the deflection patterns. Before the so-called critical instability, the film under compression is found to go through a transition stage. Overall, the deflection increment in this stage is negligible except approaching the critical state. However, the dominant wavelength is found to be continuously growing (or decreasing) rather than suddenly appears upon reaching the so-called critical state, and, interestingly, such growth is found to be independent of the intensity and pattern of the initial imperfection if the same initial dominant wavelength is guaranteed. In the discussion, for both the transition and buckling stages, evolution laws of the deflection amplitude and wavelength are established analytically and found to agree well with the numerical results. This research clearly presents the actual evolution process of wrinkling morphology from linear in-plane deformation with small stable deflection to out-of-plane instability with large deflection, which deepens the cognition of instability behavior of films and provides a basis for related applications such as high-precision mechanical characterization.

Buckling and Post-Buckling of A Stiff Film Resting on an Elastic Graded Substrate

Wrinkling and Creasing of A Compressed Elastoplastic Film Resting on A Soft Substrate

Surface effects on the wrinkles in a stiff thin film bonded to a compliant substrate

Buckling of a Stiff Thin Film on a Compliant Substrate in Large Deformation

Buckling of a Stiff Thin Film on an Elastic Graded Compliant Substrate

Generation of Buckling and Wrinkling in Elastic Films: the Effect of Initial Imperfection.

Buckling and Postbuckling of a Compressed Thin Film Bonded on a Soft Elastic Layer: a Three-Dimensional Analysis

A Simply Analytic Study of Buckled Thin Films on Compliant Substrates

Surface wrinkling of a film coated to a graded substrate

Wrinkling of Thin Films on a Microstructured Substrate

Surface Wrinkling of an Elastic Graded Layer.

Surface Wrinkling of Nanostructured Thin Films on a Compliant Substrate

Buckling of a Stiff Thin Film Embedded Between Two Compliant Substrates

Numerical Analysis on the Wrinkling Instability of a Stiff Film Adhering to an Elastic Substrate with a Graded Coating

Finite Deformation Mechanics In Buckled Thin Films On Compliant Supports

Wrinkling Behavior of Variable Thickness Films Bonded to Elastic Substrates

Effects of Tension–compression Asymmetry on the Surface Wrinkling of Film–substrate Systems

Instabilities of Thin Films on a Compliant Substrate: Direct Numerical Simulations from Surface Wrinkling to Global Buckling

Buckling And Surface Wrinkling Of An Elastic Graded Cylinder With Elastic Modulus Arbitrarily Varying Along Radial Direction

Local Versus Global Buckling Of Thin Films On Elastomeric Substrates

Nonlinear Analysis of Compressed Elastic Thin Films on Elastic Substrates: from Wrinkling to Buckle-Delamination