In Situ X-ray Scattering Studies of the Influence of an Additive on the Formation of a Low-Bandgap Bulk Heterojunction

Felicia A. Bokel,Sebastian Engmann,Andrew A. Herzing,Brian A. Collins,Hyun Wook Ro,Dean M. DeLongchamp,Lee J. Richter,Eric Schaible,Alexander Hexemer
DOI: https://doi.org/10.1021/acs.chemmater.6b05358
IF: 10.508
2017-03-03
Chemistry of Materials
Abstract:The evolution of the morphology of a high-efficiency, blade-coated, organic-photovoltaic (OPV) active layer containing the low band gap polymer poly­[(4,8-bis­[5-(2-ethylhexyl)­thiophene-2-yl]­benzo­[1,2-b:4,5-b′]­dithiophene)-2,6-diyl-alt-(4-(2-ethylhexanoyl)-thieno­[3,4-b]­thiophene))-2,6-diyl] (PBDTTT-C-T) is examined by in situ X-ray scattering. In situ studies enable real-time characterization of the effect of the processing additive 1,8-diiodoocatane (DIO) on the active layer morphology. In the presence of DIO, X-ray scattering indicates that domain structure radically changes and increases in purity, while X-ray diffraction reveals little change in crystallinity/local order. The solidification behavior of this active layer differs dramatically from those that strongly crystallize such as poly­(3-hexylthiophene) and small molecule containing systems, exposing significant diversity in the solidification routes relevant to high-efficiency polymer–fullerene OPV processing. In the presence of DIO, we find quantitative agreement between the evolution of the phase structure revealed by small-angle X-ray scattering and the binodal phase structure of a simple Flory–Huggins model.
materials science, multidisciplinary,chemistry, physical
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