Improving the reliability of small‐ and wide‐angle X‐ray scattering measurements of anisotropic precipitates in metallic alloys using sample rotation

Thomas Perrin,Gilbert A. Chahine,Stéphan Arnaud,Arthur Després,Pierre Heugue,Alexis Deschamps,Frédéric De Geuser
DOI: https://doi.org/10.1107/s1600576724009294
IF: 4.868
2024-11-06
Journal of Applied Crystallography
Abstract:Rotations of small‐ and wide‐angle X‐ray scattering samples during acquisition are shown to give a drastic improvement in the reliability of the characterization of anisotropic precipitates in metallic alloys.Nanometric precipitates in metallic alloys often have highly anisotropic shapes. Given the large grain size and non‐random texture typical of these alloys, performing small‐ and wide‐angle X‐ray scattering (SAXS/WAXS) measurements on such samples for determining their characteristics (typically size and volume fraction) results in highly anisotropic and irreproducible data. Rotations of flat samples during SAXS/WAXS acquisitions are presented here as a solution to these anisotropy issues. Two aluminium alloys containing anisotropic precipitates are used as examples to validate the approach with a −45°/45° angular range. Clear improvements can be seen on the SAXS I(q) fitting and the consistency between the different SAXS/WAXS measurements. This methodology results in more reliable measurements of the precipitate's characteristics, and thus allows for time‐ and space‐resolved measurements with higher accuracy.
chemistry, multidisciplinary,crystallography
What problem does this paper attempt to address?