Nonhalogen Dry Etching of Metal Carbide TiAlC by Low-Pressure N 2 /H 2 Plasma at Room Temperature

Thi-Thuy-Nga Nguyen,Kazunori Shinoda,Shih-Nan Hsiao,Kenji Maeda,Kenetsu Yokogawa,Masaru Izawa,Kenji Ishikawa,Masaru Hori
DOI: https://doi.org/10.1021/acsami.4c11025
IF: 9.5
2024-09-23
ACS Applied Materials & Interfaces
Abstract:Ternary metal carbide TiAlC has been proposed as a metal gate material in logic semiconductor devices. It is a hard-to-etch material due to the low volatility of the etch byproducts. Here, a simple, highly controllable, and dry etching method for TiAlC has been first presented using nonhalogen N(2)/H(2) plasmas at low pressure (several Pa) and 20 °C. A capacitively coupled plasma etcher was used to generate N(2)/H(2) plasmas containing active species, such as N, NH, and H to modify the metal...
materials science, multidisciplinary,nanoscience & nanotechnology
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