Electron beam induced current in the high injection regime

Paul M Haney,Heayoung P Yoon,Prakash Koirala,Robert W Collins,Nikolai B Zhitenev
DOI: https://doi.org/10.1088/0957-4484/26/29/295401
IF: 3.5
2015-07-02
Nanotechnology
Abstract:Electron beam induced current (EBIC) is a powerful technique which measures the charge collection efficiency of photovoltaics with sub-micron spatial resolution. The exciting electron beam results in a high generation rate density of electron-hole pairs, which may drive the system into nonlinear regimes. An analytic model is presented which describes the EBIC response when the total electron-hole pair generation rate exceeds the rate at which carriers are extracted by the photovoltaic cell, and charge accumulation and screening occur. The model provides a simple estimate of the onset of the high injection regime in terms of the material resistivity and thickness, and provides a straightforward way to predict the EBIC lineshape in the high injection regime. The model is verified by comparing its predictions to numerical simulations in one- and two-dimensions. Features of the experimental data, such as the magnitude and position of maximum collection efficiency versus electron beam current, are consistent with the three-dimensional model.
materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology
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