Correlation between crystal structure and dielectric characteristics of Ti4+ substituted CaSnSiO5 ceramics

Kang Du,Fei Wang,Xiao-Qiang Song,Yan-Bo Guo,Xiao-Chuan Wang,Wen-Zhong Lu,Wen Lei
DOI: https://doi.org/10.1016/j.jeurceramsoc.2020.12.010
IF: 5.7
2021-04-01
Journal of the European Ceramic Society
Abstract:The crystal structure and dielectric properties of Ti4+-substituted CaSnSiO5 ceramic were investigated. Ti4+ entirely substituted Sn4+ of CaSnSiO5, and the solid solutions were formed at Ca(Sn1- x Ti x )SiO5 (0 ≤ x ≤ 1.0) ceramics. The evolutions of crystal structure were analysed through Rietveld refinement and transmission electron microscopy, and the phase transition from A2/a to P21/a space groups at Ca(Sn1- x Ti x )SiO5 (0.9 ≤ x ≤ 1.0) ceramics was clarified. The change in dielectric properties was related to the structural evolution of Ca(Sn1- x Ti x )SiO5 (0 ≤ x ≤ 1.0). The τ f values of Ca(Sn1- x Ti x )SiO5 (0 ≤ x ≤ 0.4) ceramics initially decreased to +49.8 ppm/°C and then increased to +98.3 ppm/°C because of Sn/TiO6 octahedral distortion. The temperature coefficient of capacitance and ε r anomaly peak were controlled by Ti4+ substitution for Sn4+ at Ca(Sn1- x Ti x )SiO5 (0.4 ≤ x ≤ 1.0) ceramics. The results provided a way to control the τ f value of microwave dielectric ceramics.
materials science, ceramics
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