Translucency measurement system based on a polarized camera

Pei-Yu Lai,Tzung-Han Lin

DOI: https://doi.org/10.1364/ao.507311

IF: 1.9

2024-02-01

Applied Optics

Abstract:Pei-Yu Lai, Tzung-Han Lin This paper proposes a measurement system capable of estimating the transmittance and haze values of a composite object. The system, ... [Appl. Opt. 63, 1170-1181 (2024)]

optics

What problem does this paper attempt to address?

Design of Spectrophotometer for Measuring Polarized Transmittance and Reflectance at Different Temperature

XUE Hui,LI Hai-feng,HUANG Wen-biao,GU Pei-fu

DOI: https://doi.org/10.3785/j.issn.1008-973x.2007.09.019

2007-01-01

Abstract:A spectrophotometer for measuring the polarized transmittance and reflectance of optical coating at different incident angle and temperature was developed,including the optical system,mechanical structure and data sampling method.The spectrophotometer actualizes polarization-auto-calibration by using polarimeter rotation method and multi-angle reflectance measurement by using integral sphere rotation method,and can be used to measure temperature-induced spectrum shift.The sources of errors such as light source,environment light and sample thickness and their resolutions were discussed.The results indicate that this type of spectrophotometer can be applied into practice.
Measuring Spectral Reflectance and Transmittance of Heavy Caliber Optical Thin-Film

谢云,刘骏,李海峰,刘旭,顾培夫

DOI: https://doi.org/10.3969/j.issn.1005-5630.2004.02.036

2004-01-01

Abstract:The automatic measuring system has been designed, which can measure the transmissivity and reflectivity of heavy caliber optical thin-film in wide spectral band and wide angular range. The implementation of the machine structure for measuring thick samples at large angle was discussed emphatically. We also introduced the optical system and the data acquisition module as well. At last, the paper analyzes various measurement errors and gives corresponding solutions.
Practical Measurements of Translucent Materials with Inter-Pixel Translucency Prior

Zhenyu Chen,Jie Guo,Shuichang Lai,Ruoyu Fu,mengxun kong,Chen Wang,Hongyu Sun,Zhebin Zhang,Chen Li,Yanwen Guo

DOI: https://doi.org/10.1109/cvpr52733.2024.01978

2024-01-01

Abstract:Material appearance is a key component of photorealism, with a pronounced impact on human perception. Although there are many prior works targeting at measuring opaque materials using light-weight setups (e.g., consumer-level cameras), little attention is paid on acquiring the optical properties of translucent materials which are also quite common in nature. In this paper, we present a practical method for acquiring scattering properties of translucent materials, based solely on ordinary images captured with unknown lighting and camera parameters. The key to our method is an inter-pixel translucency prior which states that image pixels of a given homogeneous translucent material typically form curves (dubbed translucent curves) in the RGB space, of which the shapes are determined by the parameters of the material. We leverage this prior in a specially-designed convolutional neural network comprising multiple encoders, a translucency-aware feature fusion module and a cascaded decoder. We demonstrate, through both visual comparisons and quantitative evaluations, that high accuracy can be achieved on a wide range of real-world translucent materials.
A New Method for Measuring Multilayer Thickness Using a Chromatic Confocal Sensor

Tiancheng Liu,Yutong Hong,Jiajun Wu,Wule Zhu,Bingfeng Ju

DOI: https://doi.org/10.1007/s41871-024-00241-w

2024-01-01

Nanomanufacturing and Metrology

Abstract:Multilayer transparent plates play a crucial role in industrial fields, such as optical lenses, electrodes, and solar panels, because of their superior optical and electrical properties. The thickness and uniformity of such plates are decisive for the quality of the final product. However, traditional contact measurement methods are inadequate in accuracy and pose the risk of damaging the plates, making nondestructive measurement of multilayer transparent plate thickness rather challenging. A new measurement technology is urgently needed. This study proposes a new method for the thickness measurement of multilayer transparent plates based on chromatic confocal sensor technology. First, we investigated the dispersive behavior of light in various media layers and derived theoretical measurement models for single-layer and multilayer transparent plate thicknesses. Subsequently, we designed and constructed a measurement system using a C-series chromatic confocal sensor and optical instruments and prepared a five-layer transparent sample consisting of quartz and air layers to confirm the feasibility of the method. The results of the experiment show that the proposed method can accurately measure the thickness of the five-layer sample with a maximum absolute error within 13 µm and a maximum relative error of 4.27
Transparent Anisotropic Films Measurement with a Polarized Angle-Resolved Spectroscopy

Lihua Peng,Dawei Tang,Jian Wang,Long Xu,Wenlong Lu,Rong Chen,Liping Zhou

DOI: https://doi.org/10.1117/12.2666965

2023-01-01

Abstract:Polarized angle-resolved spectroscopy is introduced to measure transparent anisotropic films with back focal plane imaging by virtue of its rich information provided at various incident and azimuthal angles. The polarized angle-resolved spectroscopy provides a conoscopic interferogram and angle-resolved spectrum to deal with the complex characterization parameters of an anisotropic film, including the thickness, principal refractive index, and optical axis. Firstly, the optics model of a transparent anisotropic film is built by superpositioning the incoherent waves from the front and rear surfaces with coherency matrices formalism when the optical length is larger than the coherent length, and the incoherent issue arises. Then the optical axis of the anisotropic sample can be determined by the conoscopic interference image with the melatope, which marks zero phase difference between the ordinary and extraordinary waves. The measured angle-resolved reflectance spectrum and anisotropic interference phase are fitted to the optics model of the film with coherency matrix formalism, utilizing the Levenberg-Marquardt algorithm to calculate the thickness and dispersion principal refractive index within a single shot. The thickness and anisotropic refractive index are determined for sapphire and polyethylene terephthalate (PET) samples with our homemade polarized angle-resolved spectrometer. The thickness measurement results show that the relative error of the proposed method is less than 1.45%.
A polarimeter based on electric-optical material

Yubo Li,WenJian Jia,Zhengjue Wu,Guobing Wang,Minghua Wang,Jianyi Yang

DOI: https://doi.org/10.1117/12.688152

2006-01-01

Abstract:This paper presents a polarimeter for simultaneous measurement of variation in magnitude phase retardation, azimuth and principal axis angle of the incident light. The configuration is based on dual-liquid-crystal-modulator (Dual-LCM) which is used to enhance the measurement's S/N and resolution. The changes of these three parameters are measured by a very simple digital signal processing system. Compared to the conventional configurations, the proposed polarimeter offers an easier setup, high system stability and repeatability. The results show that our system has the advantages of wide measurable domain for the whole-polarization and high measurement precision. The results indicate that the maximum absolute errors of the phase retardation, azimuth and principal axis angle are 0.24 degrees, 0.14 degrees and 0.31 degrees, respectively. Finally, the dynamic ranges of the principal-axis angle measurement and the phase-retardation measurement extend as far as 360 degrees and the measurement precision is below 0.31 degrees.
Measurement technology based on a Stokes parametric polarization system

Zhenmin Zhu,Hongwei Qiu,Wenqing Long,Lifa He,Dongdong Xie,Yinsong Ye

DOI: https://doi.org/10.1364/ao.517878

IF: 1.9

2024-04-25

Applied Optics

Abstract:Zhenmin Zhu, Hongwei Qiu, Wenqing Long, Lifa He, Dongdong Xie, Yinsong Ye Structured light measurement systems often use polarization filters to reduce image interference from highly reflective areas. This method ... [Appl. Opt. 63, 3495-3505 (2024)]

optics
Polymer Composites with High Haze and High Transmittance

Yue Ru,Xiaohong Zhang,Li Wang,Liming Dai,Wantai Yang,Jinliang Qiao

DOI: https://doi.org/10.1039/c5py01072a

IF: 4.6

2015-01-01

Polymer Chemistry

Abstract:Novel light scattering polymer composites with high transmittance and high haze have been developed by using cross-linked copolymer (CM-SMC) microspheres as light scattering fillers. By using these novel light scattering polymer composite materials, compared to the conventional materials, 20% of the illumination energy can be saved when used for LEDs.
Optical transmittance measurement system for coated elements with low transmittance

Hongyun Wang,Zhengshang Da,Lili Liu,Juanning Zhao

DOI: https://doi.org/10.1364/ao.51.002395

IF: 1.9

2012-04-27

Applied Optics

Abstract:The low-transmittance elements required for a high power laser facility have stringent specifications about transmittance. To validate optic performance against specifications, a metrology system for transmittance is proposed. The system is composed of a laser source, an integrating sphere, a power meter, and four uncoated wedged glasses. A relative measurement method is adopted, which is that the surface reflectivity of uncoated glass is used as the reference to compare with the sample's transmittance. The systematic feature is that uncoated wedged glasses are applied to split and reflect beams, which not only avoid coating errors, but also make the two beam powers attenuate properly. Measurement results for a sample's transmittance are presented. Experiment and analysis show that the relative standard uncertainty (σ(T)/T) of measurement is 0.424%. This system is available for large-aperture elements.

optics
Apparatus for measuring the uniformity of the optical transmittance of a semispherical surface at normal incidence

Shenghao Wang,Shijie Liu,Jianda Shao,Tianzhu Xu,Qi Lu,Shen Qi,Minghui Feng,Long Zhang

DOI: https://doi.org/10.1364/ao.57.003395

IF: 1.9

2018-04-24

Applied Optics

Abstract:In this paper, we build an apparatus for measuring the optical transmittance and its uniformity for a semispherical surface at normal incidence; the system is primarily comprised of a traditional double-beam photometric framework and a novel custom-made mechanical structure with multidimensional degrees of freedom. During the measurement process, a key aligning step is adopted to guarantee that the center point of the semispherical surface stands still in the light beam while scanning the hemispherical optical element point by point around the horizontal and vertical axes, which ensures that the laser beam is always normally incident onto the surface of the hemisphere. The experimental results show that the uniformity of the optical transmittance for a semispherical optical glass can be successfully characterized by the system, with a three-cycle repeatability error of 0.026% being demonstrated. Our system solves the problem of traditional spectrophotometers when measuring the spectral property of a hemispherical surface and thus can be popularized in similar applications.

optics
Optical measuring of translucent film by radiometer

JU Sheng-Hong,XU Xiang-Hua,LIANG Xin-Gang

2010-01-01

Kung Cheng Je Wu Li Hsueh Pao/Journal of Engineering Thermophysics

Abstract:With the development of photoelectricity technology, different kinds of optical films have come into widely use. The using of optical film is based on the measurement of optical property (transmissivity, reflectivity and absorptivity). It's easy to measure the transmissivity, while difficult to get the reflectivity and absorptivity. By tracing the transfer of one beam of light among multilayer films, an easy and fast but efficiency method was developed to measure the optical property of translucent film by radiometer based on the former investigation of film measurement. When the film property is in extreme state (one of the transmissivity, reflectivity and absorptivity is very large or small), this method still can still be used and the error is usually no more than 6%.
Analysis Methods for Polarization State and Energy Transmission of Rays Propagating in Optical Systems

Liu Chao,Liu Qiangsheng,Cen Zhaofeng,Li Xiaotong

DOI: https://doi.org/10.1117/12.869444

2010-01-01

Abstract:Polarization state of only completely polarized light can be analyzed by some software, ZEMAX for example. Based on principles of geometrical optics, novel descriptions of the light with different polarization state are provided in this paper. Differential calculus is well used for saving the polarization state and amplitudes of sampling rays when ray tracing. The polarization state changes are analyzed in terms of several typical circumstances, such as Brewster incidence, total reflection. Natural light and partially polarized light are discussed as an important aspect. Further more, a computing method including composition and decomposition of sampling rays at each surface is also set up to analyze the energy transmission of the rays for optical systems. Adopting these analysis methods mentioned, not only the polarization state changes of the incident rays can be obtained, but also the energy distributions can be calculated. Since the energy distributions are obtained, the surface with the most energy loss will be found in the optical system. The energy value and polarization state of light reaching the image surface will also be available. These analysis methods are very helpful for designing or analyzing optical systems, such as analyzing the energy of stray light in high power optical systems, researching the influences of optical surfaces to rays' polarization state in polarization imaging systems and so on.
A Novel Four-Wavelength Transmissometer for Distinguishing Haze and Fog

Jiuke Wang,Jietai Mao,Chunsheng Zhao,Peng Yan,Nan Ma,Pengfei Liu,Xiaoyang Liu

DOI: https://doi.org/10.1007/s13351-013-0411-5

2013-01-01

Abstract:Haze and fog exhibit different microphysical and optical properties according to Mie scattering theory. Haze particles are smaller than fog droplets. Light of a shorter wavelength is reduced more than that of a longer wavelength during haze events. In fog, the differences between the extinction coefficients at different wavelengths are not as apparent. On the basis of the different light extinction characteristics of haze and fog, a novel four-wavelength transmissometer based on charge-coupled device (CCD) imaging was designed to distinguish haze from fog with central wavelengths at 415, 516, 650, and 850 nm. The four-wavelength transmissometer was tested in an in-situ experiment during the winter of 2009. Fog was determined when the differences of the extinction coefficients at the four wavelengths were not notable, whereas haze was determined when the light at shorter wavelengths was significantly more reduced than that at longer wavelengths. A threshold which describes the relative size of the extinction coefficients at the four wavelengths was defined to distinguish between fog and haze. The four-wavelength transmissometer provided results consistent with the commercial fog monitor during several measurements made in fog and haze events, especially under conditions of low visibility and high relative humidity.
A Method for Measuring Thermal Radiation Properties of Semi-Transparent Materials

Y. P. Zhang,X. S. Ge,X. G. Liang

DOI: https://doi.org/10.1088/0957-0233/5/9/005

1994-01-01

Abstract:Films that are semi-transparent in the infrared are extensively used in solar energy applications and agriculture. For analysing the performance of such systems, it is important to know the thermal radiation properties of these films. Whereas transmissivity can be determined easily, measurement of emissivity poses a problem. The intensity usually consists of radiation emitted from the film and transmitted background radiation. In this paper a method for determining the hemispherical total emittance, reflectance and transmittance of semi-transparent films simultaneously is presented. It has the distinctive features of simplicity and high precision. The results for some transparent films are presented.
A dual-modality optical system for single-pixel imaging and transmission through scattering media

Yining Hao,Wen Chen

DOI: https://doi.org/10.1364/ol.506637

IF: 3.6

2024-01-10

Optics Letters

Abstract:Yining Hao, Wen Chen It is well recognized that it is difficult to develop an optical system to retrieve effective information when dynamic and turbid water ... [Opt. Lett. 49, 371-374 (2024)]

optics
Transmittance estimation of translucent polymeric pellets

Jiaying Wu,Zhenhua Luo,Joseph Dougherty,Renzo Shamey

DOI: https://doi.org/10.1002/col.22939

IF: 1.668

2024-05-22

Color Research & Application

Abstract:Plastics are commonly produced and sold in pellet form due to their superior handling characteristics. However, due to their small size, it is often impractical, if not unfeasible, to determine the transmittance of a single pellet instrumentally. Moreover, such measurements may be highly variable. Therefore, translucent films of certain thickness, known as plaques, are commonly molded to enable instrumental determination of their transmittance. These plaques, however, are not needed beyond the quality control process while they add a costly step to the production process. In this study, we test a method, based on the layer theory, that enables the estimation of the transmittance spectra of nearly transparent plastic plaques from the reflectance measurements of their pellet counterparts. The comparison of the estimated transmittance spectra of pellets versus measured transmittance of plaques shows the RMSE ranging from 0.37%–1.80%, with a color difference, CIEDE2000(1:1:1), of 0.07–0.48, thus validating the applicability of the method.

chemistry, applied,optics,imaging science & photographic technology
Film thickness measurement by double-wavelength infrared transmittance method

Jingwen Li,Zhen Hua,Jiao Bai,Qian Zhou,Xiaohao Wang,Kai Ni,Xinghui Li

DOI: https://doi.org/10.1117/12.2601188

2021-01-01

Abstract:Thickness measurement for the optical thin films is very important for the industries of mechanics, printing, battery and so on. Infrared transmittance method is a very useful method to achieve the physical response, which is related to the film thickness according to the Lambert-Beer law. A detail measurement system is designed with two light paths of reflectance and transmittance, consisting of the light source, filter motor, beam splitter, paraboloid mirror, PbSe detector, and so on. An experimental setup is also established with two different infrared wavelengths by two different bandpass optical filters. The stability of the measurement system is tested to be only about 0.3% in 10 min. The experiments show the feasibility of the proposed double-wavelength infrared transmittance method for film thickness measurement.
Image Dehazing with Polarization Boundary Constraints of Transmission

Tongwei Ma,Jianping Zhou,Lilian Zhang,Chen Fan,Bo Sun,Ruilei Xue

DOI: https://doi.org/10.1109/jsen.2024.3372496

IF: 4.3

2024-01-01

IEEE Sensors Journal

Abstract:We present an image dehazing approach using polarization boundary constraints of transmission (Pol-BCT) in this work. First starting from the polarization performance of the sensor, we derive the calculation methods of polarized airlight and infinite airlight by introducing Muller matrix, this method dramatically reduces noise in image dehazing. Then we propose utilizing degree of polarization of airlight to construct polarization transmission, and reconstruct the atmospheric scattering model (ASM), the constructed ASM is more suitable for dehazing in most scenes. We propose boundary constraint conditions based on polarization to refine this transmission, which can retrieve the main profile Information in various scenes. To evaluate the proposed Pol-BCT, we create a polarimetric hazy image datasets. Experiment findings show that the suggested approach outperforms previous dehazing algorithms in both qualitative and quantitative evaluations.

engineering, electrical & electronic,instruments & instrumentation,physics, applied
Study of multispectral polarization imaging in sea fog environment

Qiang Fu,Wei Yang,Linlin Si,Meng Zhang,Yue Zhang,Kaiming Luo,Juntong Zhan,Su Zhang

DOI: https://doi.org/10.3389/fphy.2023.1129517

IF: 3.718

2023-01-20

Frontiers in Physics

Abstract:Marine exploration has become a popular field of concern and research all over the world. The impact of sea fog on ocean exploration is very great, and how to carry out accurate identification of targets in the sea fog environment is a problem we urgently need to solve. In this paper, we simulated and analyzed the particle distribution characteristics of the sea fog layer by using the principle of Mie scattering, designed a spectral polarization imaging system by using Liquid Crystal Variable Retarder (LCVR) and Liquid Crystal Tunable Filter (LCTF) according to the principle of spectral spectroscopy and polarization imaging, conducted calibration experiments on liquid crystal tunable filter, and carried out experiments on visibility, wavelength and imaging distance that affect the experimental results of polarization imaging of sea fog environment. The experimental results show that the polarization decreases with the increase of imaging distance; in the typical visibility (5 km for light fog, 0.5 km for medium fog and 0.05 km for dense fog), the higher the visibility, the higher the polarization; for the typical wavelengths of visible light (450 nm, 530 nm and 670 nm), the polarization increase with the increase of wavelength.

physics, multidisciplinary
Large-Area Film Thickness Identification of Transparent Glass by Hyperspectral Imaging

Shuan-Yu Huang,Riya Karmakar,Yu-Yang Chen,Wei-Chin Hung,Arvind Mukundan,Hsiang-Chen Wang

DOI: https://doi.org/10.3390/s24165094

2024-08-06

Abstract:This study introduces a novel method for detecting and measuring transparent glass sheets using hyperspectral imaging (HSI). The main goal of this study is to create a conversion technique that can accurately display spectral information from collected images, particularly in the visible light spectrum (VIS) and near-infrared (NIR) areas. This technique enables the capture of relevant spectral data when used with images provided by industrial cameras. The next step in this investigation is using principal component analysis to examine the obtained hyperspectral images derived from different treated glass samples. This analytical procedure standardizes the magnitude of light wavelengths that are inherent in the HSI images. The simulated spectral profiles are obtained using the generalized inverse matrix technique on the normalized HSI images. These profiles are then matched with spectroscopic data obtained from microscopic imaging, resulting in the observation of distinct dispersion patterns. The novel use of images coloring methods effectively displays the thickness of the glass processing sheet in a visually noticeable way. Based on empirical research, changes in the thickness of the glass coating in the NIR-HSI range cause significant changes in the transmission of infrared light at different wavelengths within the NIR spectrum. This phenomenon serves as the foundation for the study of film thickness. The root mean square error inside the NIR area is impressively low, calculated to be just 0.02. This highlights the high level of accuracy achieved by the technique stated above. Potential areas of investigation that arise from this study are incorporating the proposed approach into the design of a real-time, wide-scale automated optical inspection system.

Translucency measurement system based on a polarized camera

Design of Spectrophotometer for Measuring Polarized Transmittance and Reflectance at Different Temperature

Measuring Spectral Reflectance and Transmittance of Heavy Caliber Optical Thin-Film

Practical Measurements of Translucent Materials with Inter-Pixel Translucency Prior

A New Method for Measuring Multilayer Thickness Using a Chromatic Confocal Sensor

Transparent Anisotropic Films Measurement with a Polarized Angle-Resolved Spectroscopy

A polarimeter based on electric-optical material

Measurement technology based on a Stokes parametric polarization system

Polymer Composites with High Haze and High Transmittance

Optical transmittance measurement system for coated elements with low transmittance

Apparatus for measuring the uniformity of the optical transmittance of a semispherical surface at normal incidence

Optical measuring of translucent film by radiometer

Analysis Methods for Polarization State and Energy Transmission of Rays Propagating in Optical Systems

A Novel Four-Wavelength Transmissometer for Distinguishing Haze and Fog

A Method for Measuring Thermal Radiation Properties of Semi-Transparent Materials

A dual-modality optical system for single-pixel imaging and transmission through scattering media

Transmittance estimation of translucent polymeric pellets

Film thickness measurement by double-wavelength infrared transmittance method

Image Dehazing with Polarization Boundary Constraints of Transmission

Study of multispectral polarization imaging in sea fog environment

Large-Area Film Thickness Identification of Transparent Glass by Hyperspectral Imaging