Direct‐Writing of 2D Diodes by Focused Ion Beams (Adv. Funct. Mater. 34/2021)

Yanran Liu,Yuanyuan Qu,Yue Liu,Hang Yin,Jinglun Liu,Yang Tan,Feng Chen
DOI: https://doi.org/10.1002/adfm.202170248
IF: 19
2021-08-01
Advanced Functional Materials
Abstract:Focused Ion Beam WritingIn article number 2102708, Yang Tan, Feng Chen, and co-workers present a new method to "print" lateral PN junctions in MoSe2/graphene bilayers via ion beam irradiation. Controllable, focused Ga+ ions generate Se-defects on the top of the heterostructures and yield unique electronic properties. This work presents focused ions as an additional strategy for the direct-writing of elementary electronic devices in 2D materials.
materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
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