Trend of Contact Surface Condition in VCB Investigated Using DC Dynamic Gap Measurement Method During Capacitive Switching

Yun Geng,Xiaofei Yao,Zilong Zhang,Haomin Li,Zaiqin Zhang,Rong Jia,Yingsan Geng,Zhiyuan Liu
DOI: https://doi.org/10.1109/tdei.2024.3510473
IF: 2.509
2024-01-01
IEEE Transactions on Dielectrics and Electrical Insulation
Abstract:The vacuum circuit breakers (VCBs) are highly suited for frequent switching of capacitor banks in reactive power compensation systems due to their durability for repetitive operations, environmental friendliness, and maintenance-free arc chambers. Understanding the influence of inrush currents on contact surface conditions provides theoretical support for enhancing the performance of VCBs in switching capacitor banks. In this paper, an experimental system based on the DC dynamic gap measurement method was developed. The effect of varying contact structures on the field emission current during DC prestrike and the consequences of inrush current prestrike arcs on the contact surface condition in vacuum interrupters (VIs) with spiral-type transverse magnetic field contacts during capacitive switching was studied. The contact surface condition is represented by field enhancement factor β. The variation trend of the field enhancement factor β and its relationship with the prestrike gap are obtained. The results indicate that series-connected VIs with spiral-type TMF contacts effectively diminish the prestrike field emission current by a maximum of 60%. The alternating effects of arcing erosion and aging are identified as key factors contributing to the increased variability in contact surface conditions.
What problem does this paper attempt to address?