Inrush Current Prestrike Arc Behaviours Of Contact Materials Cucr50/50 And Cuw10/90

Yongxiang Yu,Yun Geng,Yingsan Geng,Jianhua Wang,Zhiyuan Liu
DOI: https://doi.org/10.1109/TPS.2016.2640341
IF: 1.368
2017-01-01
IEEE Transactions on Plasma Science
Abstract:In the case of back-to-back capacitor banks switching, the inrush current arcs can locally melt the contact surfaces of vacuum interrupters (VIs) during the prestrike process. The contact materials significantly influence the behaviours of the inrush current prestrike arcs. The objective of this paper is to determine the influence of contact materials on prestrike arc behaviours of VIs during capacitive making processes. Six identical 12-kV VIs were used in the experiment after the proposed conditioning. The contact diameter of the VIs was 48 mm, and the insulating envelope was transparent. There were no metal vapour shields inside the VIs to enable the observation of the prestrike arcs. Two different contact materials (CuCr50/50 and CuW10/90) were used in the experiment. Test inrush currents were set to 5-, 10-, and 20-kA peak values, respectively. The inrush current arc features were recorded by a high-speed charge-coupled device video camera. It is discovered that the contact materials have a significant influence on the prestrike gaps. Moreover, the prestrike arcs in VIs with the CuW10/90 contact material tend to be more diffuse than those in VIs with the CuCr50/50 contact material. The results indicate the impact of different contact materials on the prestrike arc behaviours and reveal the contact erosion patterns for different materials.
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