Abstract:Even when aberration-corrected electron microscopy is in the ascendant, the microstructural analysis of materials faces the problems of residual aberrations, zone-axis deviation, surface damage, and irradiation damage, which not only have kept the spatial resolution of the electron microscope at about 0.5 Å for years, but also limited the reliability and accuracy of the microstructural analysis. Electron ptychography is a computational imaging method that utilizes the rich information in four-dimensional scanning transmission electron microscopy datasets to obtain high spatial resolution, phase accuracy, and dose efficiency. Recently, the information limit of microscopic imaging has reached 0.14? by local-orbital ptychography. Electron ptychography consists of two stages: data acquisition and numerical reconstruction. In the data acquisition stage, a four-dimensional scanning transmission electron microscopy dataset is formed by recording the two-dimensional diffraction patterns at each position by means of a pixelated detector during the two-dimensional scanning of the electron beam on the sample. In the numerical reconstruction stage, the amplitude and phase of the sample are retrieved from these datasets by means of suitable algorithms. In contrast to aberration correction, which reduces the effect of lens aberrations on the imaging quality, electron ptychography eliminates this effect and achieves aberration-free imaging, reproducing the true structure of the sample nearly perfectly. We briefly introduce the basic principles and algorithms of electron ptychography from the perspective of the main problems faced by the microstructure analysis of materials, and introduce the main features of electron ptychography through application examples.

A Methodology for Robust Multislice Ptychography

Sampling metrics for robust reconstructions in multislice ptychography: Theory and experiment

Multi-slice Ptychographic Imaging with Multistage Coarse-to-fine Reconstruction

Inverse Multislice Ptychography by Layer-wise Optimisation and Sparse Matrix Decomposition

Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements

A high-performance reconstruction method for partially coherent ptychography

Large step size fly-scan ptychography using local sample separation reconstruction

Multi-Convergence-Angle Ptychography with Simultaneous Strong Contrast and High Resolution

Robust Ptychographic Reconstruction with an Out-of-Focus Electron Probe

Electron Ptychographic Microscopy For Three-Dimensional Imaging

Lossy Compression of Electron Diffraction Patterns for Ptychography via Change of Basis

Virtual Depth-Scan Multi-Slice Ptychography for Improved Three-Dimensional Imaging.

Introduction to Electron Ptychography for Materials Scientists

Near-Isotropic Sub-Ångstrom 3D Resolution Phase Contrast Imaging Achieved by End-to-End Ptychographic Electron Tomography

High-speed Three-dimensional Imaging at the Nanoscale Via Fly-scan Ptycho-tomography

Towards 3D Electron Ptychographic Reconstruction

Noise-Robust Ptychography Using Dynamic Sigmoid-Remolding

Uncovering the three-dimensional structure of upconverting core–shell nanoparticles with multislice electron ptychography

Iterative X-ray Spectroscopic Ptychography

Electronvolt energy resolution with broadband ptychography

Uncovering the Three-Dimensional Structure of Upconverting Core-Shell Nanoparticles with Multislice Electron Ptychography