High Resolution Displacement Measurement by a Novel Michelson Laser

Xiaomin Qin,Zijie Liu,Zhiyang Wang,Hangbo Shi,Tiantian Shi,Jingbiao Chen
DOI: https://doi.org/10.1109/eftf61992.2024.10722644
2024-01-01
Abstract:High-resolution displacement measurement is crucial in precision machining, biomedical sensing, and other fields. In this paper, we propose a novel displacement measurement scheme based on Michelson lasers, which obtains the cavity length variations from the laser frequency change, tracing displacement measurement to laser frequency measurement with high resolution. Furthermore, we present a Faraday-Michelson laser configuration utilizing the narrowband Faraday anomalous dispersion atomic filter as the frequency selection device, enabling simultaneous oscillation output of two laser beams. With frequency measurement achieving resolutions up to 12 digits, our scheme can theoretically reach a displacement measurement resolution in pm or even finer. It exceeds the current resolution of displacement measurement by laser interferometers, and can be used for precision displacement measurement and control of lithography machine and so on, paving the way for future advancements in high-resolution displacement measurement.
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