Study of Displacement Measurement with Nanometer Resolution Based on Birefringent Dual-frequency HeNe Laser Power Turning

Yan LI,Shu-lian ZHANG,Jie FU,Zhi-guang XU
DOI: https://doi.org/10.3969/j.issn.1001-5078.2001.02.012
2001-01-01
Abstract:A novel principle on displacement measurment with nanometer resolution based on birefringent dual-frequency HeNe laser is presented.We transformed the displacement to be measured into the change of cavity length of a frequency-split HeNe laser.Based upon intensity tuning characteristics of the two split frequencies (ordinary light and extraordinary light),we realized the measurement with λ/2(about 0.3μm)resolution and large measuring range (several millimeters).And in the measuring range of λ/2,we utilized the point where o-light and e-light have equal intensity to improve the resolution of measurement up to nanometer.With combining measurement of low resolution in large measuring range with high resolution in small measuring range,we demonstrated a new method for displacement measurement with nanometer resolution and relatively large measuring range.
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