Hybrid Illumination Angle Calibration for Fourier Ptychography Microscope

Chen Liang,Fan Feng,Pingyong Xu,Heng Mao

DOI: https://doi.org/10.1364/3d.2024.jm4a.14

2024-01-01

Abstract:We proposed a hybrid calibration method for quantitative correction of illumination angle misalignments in Fourier ptychography microscope. This method combines system parameter pre-calibration with online sample-include calibration to ensure high-quality results.

What problem does this paper attempt to address?

A Positional Misalignment Correction Method for Fourier Ptychographic Microscopy Based on the Quasi-Newton Method with a Global Optimization Module

Jinlei Zhang,Xiao Tao,Peng Sun,Zhenrong Zheng

DOI: https://doi.org/10.1016/j.optcom.2019.07.046

IF: 2.4

2019-01-01

Optics Communications

Abstract:Fourier ptychographic microscopy (FPM) can achieve high resolution imaging with a wide field-of-view, in which, the position of the LED sources determines the quality of the reconstructed image. In this paper, a positional misalignment correction method, which is based on the quasi-Newton method combined with a global optimization module, is proposed to recover a high quality and high-resolution image with positional error of the LED sources. In the method, the global optimization module optimizes the LED position at first, which gives the quasi-Newton method a better initial position estimate. Simulation and experiment have been performed to verify the effectiveness of the proposed method. The results show that, compared with state-of-the-art positional misalignment correction algorithms, the method achieves better reconstruction quality and makes the reconstruction process converge faster and more stable. The proposed method has also been proven to have great potential for correcting large random positional misalignment.
Effect of spatial spectrum overlap on fourier ptychographic microscopy

Qiulan Liu,Cuifang Kuang,Yue Fang,Peng Xiu,Yicheng Li,Ruixin Wen,Xu Liu

DOI: https://doi.org/10.1142/S1793545816410042

IF: 2.396

2017-01-01

Journal of Innovative Optical Health Sciences

Abstract:Fourier ptychographic microscopy (FPM) is a newly developed imaging technique which stands out by virtue of its high-resolution and wide FOV. It improves a microscope's imaging performance beyond the diffraction limit of the employed optical components by illuminating the sample with oblique waves of different incident angles, similar to the concept of synthetic aperture. We propose to use an objective lens with high-NA to generate oblique illuminating waves in FPM. We demonstrate utilizing an objective lens with higher NA to illuminate the sample leads to better resolution by simulations, in which a resolution of 0.28 mu m is achieved by using a high-NA illuminating objective lens (NA = 1.49) and a low-NA collecting objective lens (NA = 0.2) in coherent imaging (lambda = 488 nm). We then deeply study FPM's exact relevance of convergence speed to spatial spectrum overlap in frequency domain. The simulation results show that an overlap of about 60% is the optimal choice to acquire a high-quality recovery (520*520 pixels) with about 2 min ' s computing time. In addition, we testify the robustness of the algorithm of FPM to additive noises and its suitability for phase objects, which further proves FPM's potential application in biomedical imaging.
Structured Illumination Fluorescence Fourier Ptychographic Microscopy

Peng Xiu,Youhua Chen,Cuifang Kuang,Yue Fang,Yifan Wang,Jiannan Fan,Yingke Xu,Xu Liu

DOI: https://doi.org/10.1016/j.optcom.2016.06.075

IF: 2.4

2016-01-01

Optics Communications

Abstract:We apply a Fourier ptychographic algorithm for fluorescent samples using structured illumination. The samples are illuminated with structured light patterns and the raw imaging data using traditional structured illumination fluorescence microscopy (SIM) are acquired. We then extract equivalent oblique illuminated images of fluorescent samples from the SIM images. An optimized Fourier ptychography algorithm is proposed, which ensures the fidelity of the reconstructed the super-resolution results. This method can break the diffraction limit to a resolution of λ/4, and has a better signal-to-noise ratio (SNR) than SIM, especially when the background noise is high.
Tunable-illumination for Laser Fourier Ptychographic Microscopy Based on a Background Noise-Reducing System

Xiao Tao,Jinlei Zhang,Chenning Tao,Peng Sun,Rengmao Wu,Zhenrong Zheng

DOI: https://doi.org/10.1016/j.optcom.2020.125764

IF: 2.4

2020-01-01

Optics Communications

Abstract:It is inherently difficult for a conventional microscopic imaging system to produce images with both wide field of view (FOV) and high-resolution because of its limited space bandwidth product. Fourier ptychographic microscopy (FPM) has been developed to overcome this limitation by using angle-varied illumination to enhance the performance of the system. In this paper, we propose a FPM imaging approach that employs a laser source with a newly developed illumination control optical system. The proposed system consists of a digital micromirror device and a zoom system with a condenser lens to provide sample illumination with angle-varied pattern directions and controllable pattern sizes. In addition, a total internal reflection prism is employed in the system to remove unexpected background noise and extend the FOV for reconstruction. The proposed system is validated against a USAF resolution target and a biological sample, and as a result reconstructs images with higher resolution and more details once the positional misalignment correction algorithm is employed. We envision that the proposed FPM system will be suitable for high-speed imaging applications.
Adaptive Selection of Illumination Based on 3d Fourier Ptychography

Linjing Zhu,Shengqian Chang,Jing Liu,Anqiu Chen,Siqi Liu,Haiyu Zhang,Fei Yuan,Zhenrong Zheng

DOI: https://doi.org/10.1364/cleo_at.2016.jw2a.2

2016-01-01

Abstract:Based on 3D Fourier ptychography imaging technique, adaptive selection of illumination utilizing the relationship between Fourier spectrum and illumination angle is proposed. The method reduces almost 50% computational work and accelerates the imaging reconstruction without loss of image quality.
System calibration method for Fourier ptychographic microscopy.

An Pan,Yan Zhang,Tianyu Zhao,Zhaojun Wang,Dan Dan,Ming Lei,Baoli Yao

DOI: https://doi.org/10.1117/1.JBO.22.9.096005

IF: 3.758

2017-01-01

Journal of Biomedical Optics

Abstract:Fourier ptychographic microscopy (FPM) is a recently proposed computational imaging technique with both high-resolution and wide field of view. In current FPM imaging platforms, systematic error sources come from aberrations, light-emitting diode (LED) intensity fluctuation, parameter imperfections, and noise, all of which may severely corrupt the reconstruction results with similar artifacts. Therefore, it would be unlikely to distinguish the dominating error from these degraded reconstructions without any preknowledge. In addition, systematic error is generally a mixture of various error sources in the real situation, and it cannot be separated due to their mutual restriction and conversion. To this end, we report a system calibration procedure, termed SC-FPM, to calibrate the mixed systematic errors simultaneously from an overall perspective, based on the simulated annealing algorithm, the LED intensity correction method, the nonlinear regression process, and the adaptive step-size strategy, which involves the evaluation of an error metric at each iteration step, followed by the re-estimation of accurate parameters. The performance achieved both in simulations and experiments demonstrates that the proposed method outperforms other state-of-the-art algorithms. The reported system calibration scheme improves the robustness of FPM, relaxes the experiment conditions, and does not require any preknowledge, which makes the FPM more pragmatic. (C) 2017 Society of Photo-Optical Instrumentation Engineers (SPIE)
Aberration Correction Method For Fourier Ptychographic Microscopy Based On Neural Network

Jinlei Zhang,Xiao Tao,Chenning Tao,Peng Sun,Zhanghao Ding,Chang Wang,Zhenrong Zheng

DOI: https://doi.org/10.1117/12.2573583

2020-01-01

Abstract:Fourier ptychographic microscopy (FPM) is a recently developed computational imaging technology, which achieves high-resolution imaging with a wide filed-of-view by overcoming the limitation of the optical spatial-bandwidth-product (SBP). In the traditional FPM system, the aberration of the optical system is ignored, which may significantly degrade the reconstruction results. In this paper, we propose a novel FPM reconstruction method based on the forward neural network models with aberration correction, termed FNN-AC. Zernike polynomials are used to indicate the wavefront aberration in our method. Both the spectrum of the sample and coefficients of different Zernike modes are treated as the learnable weights in the trainable layers. The location of the LED and the captured low-resolution images are used as the input layers of the model, while the updated low-resolution complex wave are used as output layer. The loss function of the model is set as the difference between the updated complex wave and the original complex wave. By minimizing the loss function in the training process, the coefficients of different Zernike modes can be trained, which can be used to correct the aberration of the optical system. After the training process of the model, the high-resolution complex image can be obtained based on the trained spectrum of the sample. Simulation has been performed to verify the effectiveness of the proposed method.
Transformed pupil-function misalignment calibration strategy for Fourier ptychographic microscopy

Hongnian Liu,Ting Xu,Yiwen Chen,YunCheng Wang,Jianan Li

DOI: https://doi.org/10.1364/oe.515196

IF: 3.8

2024-03-14

Optics Express

Abstract:Hongnian Liu, Tingfa Xu, Yiwen Chen, Yuncheng Wang, Jianan Li Fourier ptychographic microscopy (FPM) is an enabling quantitative phase imaging technique with both high-resolution (HR) and wide ... [Opt. Express 32, 11429-11446 (2024)]

optics
Correction Algorithms of Pupil Aberration for Fourier Ptychographic Microscopy

Minli Chen,Zhaofeng Cen,Xiaotong Li

DOI: https://doi.org/10.1117/12.2501104

2018-01-01

Abstract:Fourier ptychographic microscopy (FPM) is a newly developed imaging approach for achieving wide field and high resolution. However, image quality will degraded by the pupil aberration because of the limitation of geometrical optics. In this paper, two correction algorithms of pupil aberration combining original FPM algorithm with ptychographical iterative engine (PIE) are presented and justified. And the standard coefficients of Zernike polynomial are applied for constructing the pupil aberration in the simulation. Compared to original FPM algorithm, these algorithms add constraints to the sample and the pupil during each iteration, so that the image can be reconstructed and the pupil function can be recovered simultaneously. Furthermore, we illustrate that these algorithms can not only improve robustness, but also have faster convergence under different aberrations.
Forward Imaging Neural Network with Correction of Positional Misalignment for Fourier Ptychographic Microscopy.

Jinlei Zhang,Xiao Tao,Lin Yang,Rengmao Wu,Peng Sun,Chang Wang,Zhenrong Zheng

DOI: https://doi.org/10.1364/oe.398951

IF: 3.8

2020-01-01

Optics Express

Abstract:Fourier ptychographic microscopy (FPM) is a computational imaging technology used to achieve high-resolution imaging with a wide field-of-view. The existing methods of FPM suffer from the positional misalignment in the system, by which the quality of the recovered high-resolution image is determined. In this paper, a forward neural network method with correction of the positional misalignment (FNN-CP) is proposed based on TensorFlow, which consists of two models. Both the spectrum of the sample and four global position factors, which are introduced to describe the positions of the LED elements, are treated as the learnable weights in layers in the first model. By minimizing the loss function in the training process, the positional error can be corrected based on the trained position factors. In order to fit the wavefront aberrations caused by optical components in the FPM system for better recovery results, the second model is designed, in which the spectrum of the sample and coefficients of different Zernike modes are treated as the learnable weights in layers. After the training process of the second model, the wavefront aberration can be fit according to the coefficients of different Zernike modes and the high-resolution complex image can be obtained based on the trained spectrum of the sample. Both the simulation and experiment have been performed to verify the effectiveness of our proposed method. Compared with the state-of-art FPM methods based on forward neural network, FNN-CP can achieve the best reconstruction results.
Efficient Positional Misalignment Correction Method for Fourier Ptychographic Microscopy.

Jiasong Sun,Yuzhen Zhang,Qian Chen,Chao Zuo

DOI: https://doi.org/10.1364/boe.7.001336

IF: 3.4

2016-01-01

Biomedical Optics Express

Abstract:Fourier ptychographic microscopy (FPM) is a newly developed super-resolution technique, which employs angularly varying illuminations and a phase retrieval algorithm to surpass the diffraction limit of a low numerical aperture (NA) objective lens. In current FPM imaging platforms, accurate knowledge of LED matrix's position is critical to achieve good recovery quality. Furthermore, considering such a wide field-of-view (FOV) in FPM, different regions in the FOV have different sensitivity of LED positional misalignment. In this work, we introduce an iterative method to correct position errors based on the simulated annealing (SA) algorithm. To improve the efficiency of this correcting process, large number of iterations for several images with low illumination NAs are firstly implemented to estimate the initial values of the global positional misalignment model through non-linear regression. Simulation and experimental results are presented to evaluate the performance of the proposed method and it is demonstrated that this method can both improve the quality of the recovered object image and relax the LED elements' position accuracy requirement while aligning the FPM imaging platforms.
Robust Fourier ptychographic microscopy via a physics-based defocusing strategy for calibrating angle-varied LED illumination

Chuanjian Zheng,Shaohui Zhang,Guocheng Zhou,Yao Hu,Qun Hao

DOI: https://doi.org/10.1364/boe.452507

IF: 3.4

2022-02-22

Biomedical Optics Express

Abstract:Fourier ptychographic microscopy (FPM) is a recently developed computational imaging technique for wide-field, high-resolution microscopy with a high space-bandwidth product. It integrates the concepts of synthetic aperture and phase retrieval to surpass the resolution limit imposed by the employed objective lens. In the FPM framework, the position of each sub-spectrum needs to be accurately known to ensure the success of the phase retrieval process. Different from the conventional methods with mechanical adjustment or data-driven optimization strategies, here we report a physics-based defocusing strategy for correcting large-scale positional deviation of the LED illumination in FPM. Based on a subpixel image registration process with a defocused object, we can directly infer the illumination parameters including the lateral offsets of the light source, the in-plane rotation angle of the LED array, and the distance between the sample and the LED board. The feasibility and effectiveness of our method are validated with both simulations and experiments. We show that the reported strategy can obtain high-quality reconstructions of both the complex object and pupil function even the LED array is randomly placed under the sample with both unknown lateral offsets and rotations. As such, it enables the development of robust FPM systems by reducing the requirements on fine mechanical adjustment and data-driven correction in the construction process.

radiology, nuclear medicine & medical imaging,biochemical research methods,optics
Nonlinear Optimization Approach for Fourier Ptychographic Microscopy

Yongbing Zhang,Weixin Jiang,Qionghai Dai

DOI: https://doi.org/10.1364/oe.23.033822

IF: 3.8

2015-01-01

Optics Express

Abstract:Fourier ptychographic microscopy (FPM) is recently proposed as a computational imaging method to bypass the limitation of the space-bandwidth product of the traditional optical system. It employs a sequence of low-resolution images captured under angularly varying illumination and applies the phase retrieval algorithm to iteratively reconstruct a wide-field, high-resolution image. In current FPM imaging system, system uncertainties, such as the pupil aberration of the employed optics, may significantly degrade the quality of the reconstruction. In this paper, we develop and test a nonlinear optimization algorithm to improve the robustness of the FPM imaging system by simultaneously considering the reconstruction and the system imperfections. Analytical expressions for the gradient of a squared-error metric with respect to the object and illumination allow joint optimization of the object and system parameters. The algorithm achieves superior reconstructions when the system parameters are inaccurately known or in the presence of noise and corrects the pupil aberrations simultaneously. Experiments on both synthetic and real captured data validate the effectiveness of the proposed method.
Stable and Robust Frequency Domain Position Compensation Strategy for Fourier Ptychographic Microscopy

Jian Liu,Yong Li,Weibo Wang,He Zhang,Yuhang Wang,Jiubin Tan,Chenguang Liu

DOI: https://doi.org/10.1364/oe.25.028053

IF: 3.8

2017-01-01

Optics Express

Abstract:Fourier ptychographic microscopy is a computational microscopy technique to achieve wide-field and super-resolution complex imaging which has been developed in recent years. The method is based on illuminating the sample by a light source array, and then computationally integrating different images correspondent to each of the sources, in the Fourier domain. Knowledge of the exact relative position of the light sources and the sample is critical for the quality of the final recovered image. In this paper, we present an iterative approach towards correcting the position in the Fourier domain based on Newton's method. Also, an analysis is presented which shows the relation between the position error and the deterioration of the final recovery quality. The effectiveness of the presented method in improving the quality of the final recovered image is demonstrated using simulation and experimental results. Moreover, the method is shown to be more stable and robust to noises in comparison with the state-of-the-art algorithm.
Advanced Illumination Pattern in Fourier Ptychographic Microscopy

Xingye Chen,Jiamin Wu,Chenguang Ma,Qionghai Dai

DOI: https://doi.org/10.1364/3d.2016.jt3a.41

2016-01-01

Abstract:A quasi-circle structure based illumination design for Fourier Ptychographic Microscopy is presented. The number of required LEDs can be reduced by 50% while maintaining the same reconstruction performance compared to the conventional regular square structure.
High-speed Fourier Ptychographic Microscopy for Quantitative Phase Imaging.

Yi Xiao,Shiyuan Wei,Shaolong Xue,Cuifang Kuang,Anli Yang,Maoliang Wei,Hongtao Lin,Renjie Zhou

DOI: https://doi.org/10.1364/ol.428731

IF: 3.6

2021-01-01

Optics Letters

Abstract:Fourier ptychographic microscopy (FPM), as an emerging computational imaging method, has been applied to quantitative phase imaging with resolution bypassing the physical limit of the detection objective. Due to the weak illumination intensity and long image acquisition time, the achieved imaging speed in current FPM methods is still low, making them unsuitable for real-time imaging applications. We propose and demonstrate a high-speed FPM method based on using laser illumination and digital micro-mirror devices for illumination angle scanning. In this new, to the best of our knowledge, FPM method, we realized quantitative phase imaging and intensity imaging at over 42 frames per second (fps) with around 1 µm lateral resolution. The quantitative phase images have revealed membrane height fluctuations of red blood cells with nanometer-scale sensitivity, while the intensity images have resolved subcellular features in stained cancer tissue slices.
Self-Learning Based Fourier Ptychographic Microscopy

Yongbing Zhang,Weixin Jiang,Lei Tian,Laura Waller,Qionghai Dai

DOI: https://doi.org/10.1364/oe.23.018471

IF: 3.8

2015-01-01

Optics Express

Abstract:Fourier Ptychographic Microscopy (FPM) is a newly proposed computational imaging method aimed at reconstructing a high-resolution wide-field image from a sequence of low-resolution images. These low-resolution images are captured under varied illumination angles and the FPM recovery routine then stitches them together in the Fourier domain iteratively. Although FPM has achieved success with static sample reconstructions, the long acquisition time inhibits real-time application. To address this problem, we propose here a self-learning based FPM which accelerates the acquisition and reconstruction procedure. We first capture a single image under normally incident illumination, and then use it to simulate the corresponding low-resolution images under other illumination angles. The simulation is based on the relationship between the illumination angles and the shift of the sample's spectrum. We analyze the importance of the simulated low-resolution images in order to devise a selection scheme which only collects the ones with higher importance. The measurements are then captured with the selection scheme and employed to perform the FPM reconstruction. Since only measurements of high importance are captured, the time requirements of data collection as well as image reconstruction can be greatly reduced. We validate the effectiveness of the proposed method with simulation and experimental results showing that the reduction ratio of data size requirements can reach over 70%, without sacrificing image reconstruction quality.
Accurate and stable two-step LED position calibration method for Fourier ptychographic microscopy

Haojie Wei,Jing Du,Lei Liu,Yu He,Yong Yang,Song Hu,Yan Tang

DOI: https://doi.org/10.1117/1.jbo.26.10.106502

IF: 3.758

2021-10-15

Journal of Biomedical Optics

Abstract:Significance: Fourier ptychography microscopy (FPM) is a computational optical imaging technology that employs angularly varying illuminations and a phase retrieval algorithm to achieve a wide field of view and high-resolution imaging simultaneously. In the FPM, LED position error will reduce the quality of the reconstructed high-resolution image. To correct the LED positions, current methods consider each of the LED positions as independent and use an optimization algorithm to get each of the positions. When the positional misalignment is large or the search position falls into a local optimal value, the current methods may lack stability and accuracy.Aim: We improve the model of the LED position and propose an accurate and stable two-step correction scheme (tcFPM) to calibrate the LED position error.Approach: The improved LED positions model combines the overall offset, which represents the relative deviation of the LED array and the optical axis, with the slight deviation of each LED's independent position. In the tcFPM, the overall offset of the LED array is corrected at first, which obtains an approximate value of the overall offset of the LED array. Then the position of each LED is precisely adjusted, which obtains the slight offset of each LED.Results: This LED position error model is more in line with the actual situation. The simulation and experimental results show that the method has high accuracy in correcting the LED position. Furthermore, the reconstruction process of tcFPM is more stable and significantly improves the quality of the reconstruction results, which is compared with some LED position error correction methods.Conclusions: An LED position error correction technology is proposed, which has a stable iterative process and improves the reconstruction accuracy of complex amplitude.

radiology, nuclear medicine & medical imaging,biochemical research methods,optics
Optimal Annular Illumination Pattern for Fourier Ptychographic Microscopy Based on Spectrum Aliasing Minimization

Jiasong Sun,Chao Zuo,Qian Chen

DOI: https://doi.org/10.1117/12.2573417

2021-01-01

Abstract:We present a spectrum aliasing minimization scheme for Fourier ptychographic microscopy (FPM) based on annular illumination pattern optimization. Normally, the Nyquist sampling criterion under the coherent illumination case is required due to the quasi-coherent illumination system used in the conventional FPM technique. However, the spatial sampling criterion changes with the oblique illumination angles. When the illumination NA matches the objective NA, the spatial sampling criterion should be reconsidered under the incoherent case, since the phase information is lost during intensity imaging. In this paper, an optimal annular illumination based Fourier ptychographic microscopy (OAIFPM) method is proposed. After investigating the spectrum aliasing characteristic of different spatial sampling rates and establishing an objective cost function related to the spectrum aliasing percentage and reconstruction error, the reconstruction accuracy can be improved while the incoherent spatial sampling criterion is not satisfied. The results suggest that our OAIFPM system could be a powerful imaging technique for various high-throughput microscopic applications, such as drug discovery, cellular phenotypes characterization, and identification of disease mechanisms.
Microscopic Image Enhancement Based On Fourier Ptychography Technique

Ying Wang,Guocheng Zhou,Yao Hu,Xuemin Cheng,Qun Hao,Shaohui Zhang

DOI: https://doi.org/10.1117/12.2519602

2019-01-01

Abstract:Image enhancement technique is utilized to emphasize the overall or local characteristics of pictures and widely used in aerospace, and machine vision application. However, most of these techniques are mathematical algorithms based on captured pictures instead of the imaging process. Fourier ptychographic microscopy (FPM) is a recently developed computational imaging approach which stitches together low-resolution images acquired under different angles of illumination with the same intensity in Fourier space to produce a wide-field, high-resolution complex sample image. In this article, a theoretical model about the illumination intensity is proposed. The effect of uneven illumination intensity can be reduced significantly based on our model. Furthermore, the quality of the reconstructed image can be enhanced by adjusting the intensity of the illumination light corresponding to the high frequency components of the original spectrum.

Hybrid Illumination Angle Calibration for Fourier Ptychography Microscope

A Positional Misalignment Correction Method for Fourier Ptychographic Microscopy Based on the Quasi-Newton Method with a Global Optimization Module

Effect of spatial spectrum overlap on fourier ptychographic microscopy

Structured Illumination Fluorescence Fourier Ptychographic Microscopy

Tunable-illumination for Laser Fourier Ptychographic Microscopy Based on a Background Noise-Reducing System

Adaptive Selection of Illumination Based on 3d Fourier Ptychography

System calibration method for Fourier ptychographic microscopy.

Aberration Correction Method For Fourier Ptychographic Microscopy Based On Neural Network

Transformed pupil-function misalignment calibration strategy for Fourier ptychographic microscopy

Correction Algorithms of Pupil Aberration for Fourier Ptychographic Microscopy

Forward Imaging Neural Network with Correction of Positional Misalignment for Fourier Ptychographic Microscopy.

Efficient Positional Misalignment Correction Method for Fourier Ptychographic Microscopy.

Robust Fourier ptychographic microscopy via a physics-based defocusing strategy for calibrating angle-varied LED illumination

Nonlinear Optimization Approach for Fourier Ptychographic Microscopy

Stable and Robust Frequency Domain Position Compensation Strategy for Fourier Ptychographic Microscopy

Advanced Illumination Pattern in Fourier Ptychographic Microscopy

High-speed Fourier Ptychographic Microscopy for Quantitative Phase Imaging.

Self-Learning Based Fourier Ptychographic Microscopy

Accurate and stable two-step LED position calibration method for Fourier ptychographic microscopy

Optimal Annular Illumination Pattern for Fourier Ptychographic Microscopy Based on Spectrum Aliasing Minimization

Microscopic Image Enhancement Based On Fourier Ptychography Technique