Advanced Illumination Pattern in Fourier Ptychographic Microscopy

Xingye Chen,Jiamin Wu,Chenguang Ma,Qionghai Dai

DOI: https://doi.org/10.1364/3d.2016.jt3a.41

2016-01-01

Abstract:A quasi-circle structure based illumination design for Fourier Ptychographic Microscopy is presented. The number of required LEDs can be reduced by 50% while maintaining the same reconstruction performance compared to the conventional regular square structure.

What problem does this paper attempt to address?

Structured Illumination Fluorescence Fourier Ptychographic Microscopy

Peng Xiu,Youhua Chen,Cuifang Kuang,Yue Fang,Yifan Wang,Jiannan Fan,Yingke Xu,Xu Liu

DOI: https://doi.org/10.1016/j.optcom.2016.06.075

IF: 2.4

2016-01-01

Optics Communications

Abstract:We apply a Fourier ptychographic algorithm for fluorescent samples using structured illumination. The samples are illuminated with structured light patterns and the raw imaging data using traditional structured illumination fluorescence microscopy (SIM) are acquired. We then extract equivalent oblique illuminated images of fluorescent samples from the SIM images. An optimized Fourier ptychography algorithm is proposed, which ensures the fidelity of the reconstructed the super-resolution results. This method can break the diffraction limit to a resolution of λ/4, and has a better signal-to-noise ratio (SNR) than SIM, especially when the background noise is high.
Digital micromirror device-based laser-illumination Fourier ptychographic microscopy.

Cuifang Kuang,yousi ma,renping zhou,Justin Lee,George Barbastathis,Ramachandra R Dasari,Zahid Yaqoob,Peter T C So

DOI: https://doi.org/10.1364/OE.23.026999

IF: 3.8

2015-01-01

Optics Express

Abstract:We report a novel approach to Fourier ptychographic microscopy (FPM) by using a digital micromirror device (DMD) and a coherent laser source (532 nm) for generating spatially modulated sample illumination. Previously demonstrated FPM systems are all based on partially-coherent illumination, which offers limited throughput due to insufficient brightness. Our FPM employs a high power coherent laser source to enable shot-noise limited high-speed imaging. For the first time, a digital micromirror device (DMD), imaged onto the back focal plane of the illumination objective, is used to generate spatially modulated sample illumination field for ptychography. By coding the on/off states of the micromirrors, the illumination plane wave angle can be varied at speeds more than 4 kHz. A set of intensity images, resulting from different oblique illuminations, are used to numerically reconstruct one high-resolution image without obvious laser speckle. Experiments were conducted using a USAF resolution target and a fiber sample, demonstrating high-resolution imaging capability of our system. We envision that our approach, if combined with a coded-aperture compressive-sensing algorithm, will further improve the imaging speed in DMD-based FPM systems. (C) 2015 Optical Society of America
Effect of spatial spectrum overlap on fourier ptychographic microscopy

Qiulan Liu,Cuifang Kuang,Yue Fang,Peng Xiu,Yicheng Li,Ruixin Wen,Xu Liu

DOI: https://doi.org/10.1142/S1793545816410042

IF: 2.396

2017-01-01

Journal of Innovative Optical Health Sciences

Abstract:Fourier ptychographic microscopy (FPM) is a newly developed imaging technique which stands out by virtue of its high-resolution and wide FOV. It improves a microscope's imaging performance beyond the diffraction limit of the employed optical components by illuminating the sample with oblique waves of different incident angles, similar to the concept of synthetic aperture. We propose to use an objective lens with high-NA to generate oblique illuminating waves in FPM. We demonstrate utilizing an objective lens with higher NA to illuminate the sample leads to better resolution by simulations, in which a resolution of 0.28 mu m is achieved by using a high-NA illuminating objective lens (NA = 1.49) and a low-NA collecting objective lens (NA = 0.2) in coherent imaging (lambda = 488 nm). We then deeply study FPM's exact relevance of convergence speed to spatial spectrum overlap in frequency domain. The simulation results show that an overlap of about 60% is the optimal choice to acquire a high-quality recovery (520*520 pixels) with about 2 min ' s computing time. In addition, we testify the robustness of the algorithm of FPM to additive noises and its suitability for phase objects, which further proves FPM's potential application in biomedical imaging.
Pattern-illuminated Fourier Ptychography Microscopy with a Pattern-Estimation Algorithm.

Ruizhi Cao,Tingting Yang,Yue Fang,Cuifang Kuang,Xu Liu

DOI: https://doi.org/10.1364/ao.56.006930

IF: 1.9

2017-01-01

Applied Optics

Abstract:In this paper we proposed a new method that combines random pattern illumination, the pattern-estimation algorithm, and the Fourier ptychography (FP) algorithm to recover a super-resolution image. We shifted one multispot pattern to different positions to capture images, and estimated these illumination patterns using a gradient descent algorithm that shares the same root with blind structured illumination microscopy (SIM). Based on the captured images and estimated patterns, the FP algorithm is then applied to recover a super-resolution image. Our method, termed as pattern-estimated Fourier ptychography (PEFP) microscopy, does not need the prior information about the scanning position, and is thus insensitive to rotational errors and shift errors. The performance of PEFP has been demonstrated both in simulations and experiments, and PEFP achieves better resolution than the pattern-illuminated FP method when shift errors appear in our simulations. Moreover, PEFP shows strong resistance towards aberrations and works fine when there is noise in the captured image. Compared with a newly proposed blind-SIM method, PEFP also shows better resolution enhancement both in our simulations and experiments. Our method also provides the possibility to extend the application of pattern-illuminated FP to any illumination pattern because we estimated every illumination pattern separately, as blind-SIM does.
Surface wave illumination Fourier ptychographic microscopy.

Qiulan Liu,Yue Fang,Renjie Zhou,Peng Xiu,Cuifang Kuang,Xu Liu

DOI: https://doi.org/10.1364/OL.41.005373

IF: 3.6

2016-01-01

Optics Letters

Abstract:We propose a novel microscopy method, combining surface wave illumination and the Fourier ptychographic microscopy (FPM) algorithm to achieve super-resolution (SR) imaging. In our system, an oil-immersion objective lens is used to excite both the total internal reflection (TIR) evanescent waves and the surface plasmon waves (SPWs), which illuminate the sample with large wave vectors. Through the FPM algorithm, a resolution approximately twice that of conventional wide-field microscopy is obtained. Meanwhile, we could retrieve the sample's quantitative phase map in order to obtain its surface profile. Importantly, the field enhancement from a SPW has improved the contrast of the reconstructed images, which is critical for revealing the finer structural details of the specimen. In our experiments, we have imaged metallic gratings with a 120 or 150 nm wide line and trench features. We accurately retrieved their axial dimensions with a lateral resolution better than 240 nm that is close to the theoretical resolution of 215 nm, thus demonstrating the quantitative phase imaging capability of our technique. As this approach provides a label-free solution for intensity and phase imaging of samples with lateral resolution exceeding the limit introduced by the optical system, it can be potentially used in a wide range of noninvasive biological imaging applications. (C) 2016 Optical Society of America.
Tunable-illumination for Laser Fourier Ptychographic Microscopy Based on a Background Noise-Reducing System

Xiao Tao,Jinlei Zhang,Chenning Tao,Peng Sun,Rengmao Wu,Zhenrong Zheng

DOI: https://doi.org/10.1016/j.optcom.2020.125764

IF: 2.4

2020-01-01

Optics Communications

Abstract:It is inherently difficult for a conventional microscopic imaging system to produce images with both wide field of view (FOV) and high-resolution because of its limited space bandwidth product. Fourier ptychographic microscopy (FPM) has been developed to overcome this limitation by using angle-varied illumination to enhance the performance of the system. In this paper, we propose a FPM imaging approach that employs a laser source with a newly developed illumination control optical system. The proposed system consists of a digital micromirror device and a zoom system with a condenser lens to provide sample illumination with angle-varied pattern directions and controllable pattern sizes. In addition, a total internal reflection prism is employed in the system to remove unexpected background noise and extend the FOV for reconstruction. The proposed system is validated against a USAF resolution target and a biological sample, and as a result reconstructs images with higher resolution and more details once the positional misalignment correction algorithm is employed. We envision that the proposed FPM system will be suitable for high-speed imaging applications.
Saturated Pattern-Illuminated Fourier Ptychography Microscopy

Yue Fang,Youhua Chen,Cuifang Kuang,Peng Xiu,Qiulan Liu,Baoliang Ge,Xu Liu

DOI: https://doi.org/10.1088/2040-8986/19/1/015602

IF: 2.1

2016-01-01

Journal of Optics

Abstract:We report a series of simulation studies which extends pattern-illuminated Fourier ptychography microscopy by integrating with the nonlinearity arising from saturation of the fluorophore excited state for super-resolution fluorescence imaging. This extended technique, termed Saturated pattern-illuminated Fourier ptychography (SpiFP) microscopy, could achieve a resolution four times that of wide field when the illuminating light intensity approaches the saturation threshold in simulations. Increasing light intensity leads to further resolution enhancement. In order to demonstrate the performance of SpiFP, we make a comparison between SpiFP and saturated structure illumination microscopy in simulations, and prove that the SpiFP exhibits superior robustness to noise, aberration correcting ability, and pattern's flexibility. Introducing the saturation of the fluorescent emission brings in notable improvements in imaging performance, implying its potential in nanoscale-sized biological observations by wide-field microscopy.
Phase-coded Speckle Illumination for Laser Fourier Ptychographic Microscopy

Xiao Tao,Jinlei Zhang,Peng Sun,Chang Wang,Chenning Tao,Rengmao Wu,Zhenrong Zheng

DOI: https://doi.org/10.1016/j.optcom.2021.127199

IF: 2.4

2021-01-01

Optics Communications

Abstract:It remains a tough task for designing a microscopy system to approach the diffraction limit over a wide field of view due to its restricted space bandwidth product (SBP). Fourier ptychographic microscopy (FPM) has been developed to broaden the SBP of a conventional microscope platform without major hardware modifications. In this paper, we propose a novel FPM system based on the phase-coded speckle illumination, termed PSI-FPM, which employs a laser source with a speckle illumination control optical system. A phase-only spatial light modulator (SLM) with a condenser lens is utilized in the PSI-FPM system to project the phase-coded speckle illumination patterns onto the sample. The convolution between the sample spectrum and the illumination spectrum in the Fourier domain extend the numerical aperture of the objective that acts as a low-pass filter with cut-off frequency. The SLM is introduced in the PSI-FPM system to produce the specific illumination patterns so that the number of the captured images used for reconstruction are greatly reduced. In addition, the generated pattern is scanned to different directions without mechanical movement, which improves the robustness of the system. The PSI-FPM system is validated against simulations and experiments, and as a result reconstructs high-resolution images once the phase retrieval algorithm is employed. We envision that the PSI-FPM system will be suitable for many other speckle imaging applications.
Adaptive Selection of Illumination Based on 3d Fourier Ptychography

Linjing Zhu,Shengqian Chang,Jing Liu,Anqiu Chen,Siqi Liu,Haiyu Zhang,Fei Yuan,Zhenrong Zheng

DOI: https://doi.org/10.1364/cleo_at.2016.jw2a.2

2016-01-01

Abstract:Based on 3D Fourier ptychography imaging technique, adaptive selection of illumination utilizing the relationship between Fourier spectrum and illumination angle is proposed. The method reduces almost 50% computational work and accelerates the imaging reconstruction without loss of image quality.
Wavefront Modulation with Spatial Light Modulator for Fourier Ptychographic Microscopy

Jinlei Zhang,Xiao Tao,Qin Xie,Yan Sun,Zhenrong Zheng

DOI: https://doi.org/10.1117/12.2601379

2021-01-01

Abstract:Fourier ptychographic microscopy (FPM) is a recently developed computational imaging technology, which can bypass the limitation of optical-spatial-bandwidth product to achieve imaging with both high resolution and wide field-of-view. Original FPM setup is limited to image thin samples with angle-varied illuminations. A diffuser scanning FPM method, which scans a diffuser with unknown profile between the object and objective lens to modulate the complex exit wavefront of the object, is implemented to address this 3D refocusing problem. However, since the profile of the diffuser is unknown, the number of images required for method to converge is large. A mechanical translation stage is also required, which may introduce the systematic error of the position. In this paper, we propose a new FPM method with wavefront modulation imposed by spatial light modulator (SLM). The SLM is placed between the object and the objective lens to produce specific pattern profile, which is used to modulate the complex exit wavefront of the object. Fourier ptychographic phase retrieval process is employed to recovery the complex exit wavefront of the object. With the use of SLM, it is unnecessary to employ 2D motorized translation stage to move the imposed pattern profile so that the error of translation stage is eliminated. Moreover, since the imposed pattern profile is known, the number of images required for the algorithm to converge is reduced. Simulation and experiment are performed to validate the effectiveness of our proposed method. Compared with the method, which utilizes unknown diffuser, our method can achieve a more accurate reconstruction result with a faster data acquisition and higher convergence speed.
High-Resolution Dmd-Fpm System Based On Ring Pattern Phase Retrieval Algorithm

Xiao Tao,Jinlei Zhang,Youquan Liu,Chang Wang,Wentao Zhang,Chenning Tao,Shengqian Chang,Zhenrong Zheng

DOI: https://doi.org/10.1117/12.2319648

2018-01-01

Abstract:We report an approach to enhance the resolution of the microscopy imaging by using the fourier ptychographic microscopy (FPM) method with a laser source and Spatial Light Modulator (SLM) to generate modulated sample illumination. The performance of the existed FPM system is limited by low illumination efficiency of the LED array. In our prototype setup, digital micromirror device (DMD) is introduced to replace the LED array as a reflective spatial light modulator and is placed at the front focal plane of the 4F system. A ring pattern sample illumination is generated by coding the micromirrors on the DMD, and converted to multi-angular illumination through the relay illumination system. A series of intensity sample images can be obtained by changing the size of the ring pattern and then used to reconstruct high resolution image through the ring pattern phase retrieval algorithm. Finally, our method is verified by an experiment using a resolution chart. The results also show that our method have higher reconstruction resolution and faster imaging speed.
A Positional Misalignment Correction Method for Fourier Ptychographic Microscopy Based on the Quasi-Newton Method with a Global Optimization Module

Jinlei Zhang,Xiao Tao,Peng Sun,Zhenrong Zheng

DOI: https://doi.org/10.1016/j.optcom.2019.07.046

IF: 2.4

2019-01-01

Optics Communications

Abstract:Fourier ptychographic microscopy (FPM) can achieve high resolution imaging with a wide field-of-view, in which, the position of the LED sources determines the quality of the reconstructed image. In this paper, a positional misalignment correction method, which is based on the quasi-Newton method combined with a global optimization module, is proposed to recover a high quality and high-resolution image with positional error of the LED sources. In the method, the global optimization module optimizes the LED position at first, which gives the quasi-Newton method a better initial position estimate. Simulation and experiment have been performed to verify the effectiveness of the proposed method. The results show that, compared with state-of-the-art positional misalignment correction algorithms, the method achieves better reconstruction quality and makes the reconstruction process converge faster and more stable. The proposed method has also been proven to have great potential for correcting large random positional misalignment.
Illumination Pattern Design with Deep Learning for Single-Shot Fourier Ptychographic Microscopy

Yi Fei Cheng,Megan Strachan,Zachary Weiss,Moniher Deb,Dawn Carone,Vidya Ganapati

DOI: https://doi.org/10.1364/OE.27.000644

2018-10-06

Abstract:Fourier ptychographic microscopy allows for the collection of images with a high space-bandwidth product at the cost of temporal resolution. In Fourier ptychographic microscopy, the light source of a conventional widefield microscope is replaced with a light-emitting diode (LED) matrix, and multiple images are collected with different LED illumination patterns. From these images, a higher-resolution image can be computationally reconstructed without sacrificing field-of-view. We use deep learning to achieve single-shot imaging without sacrificing the space-bandwidth product, reducing the acquisition time in Fourier ptychographic microscopy by a factor of 69. In our deep learning approach, a training dataset of high-resolution images is used to jointly optimize a single LED illumination pattern with the parameters of a reconstruction algorithm. Our work paves the way for high-throughput imaging in biological studies.

Image and Video Processing
Robust Fourier ptychographic microscopy via a physics-based defocusing strategy for calibrating angle-varied LED illumination

Chuanjian Zheng,Shaohui Zhang,Guocheng Zhou,Yao Hu,Qun Hao

DOI: https://doi.org/10.1364/boe.452507

IF: 3.4

2022-02-22

Biomedical Optics Express

Abstract:Fourier ptychographic microscopy (FPM) is a recently developed computational imaging technique for wide-field, high-resolution microscopy with a high space-bandwidth product. It integrates the concepts of synthetic aperture and phase retrieval to surpass the resolution limit imposed by the employed objective lens. In the FPM framework, the position of each sub-spectrum needs to be accurately known to ensure the success of the phase retrieval process. Different from the conventional methods with mechanical adjustment or data-driven optimization strategies, here we report a physics-based defocusing strategy for correcting large-scale positional deviation of the LED illumination in FPM. Based on a subpixel image registration process with a defocused object, we can directly infer the illumination parameters including the lateral offsets of the light source, the in-plane rotation angle of the LED array, and the distance between the sample and the LED board. The feasibility and effectiveness of our method are validated with both simulations and experiments. We show that the reported strategy can obtain high-quality reconstructions of both the complex object and pupil function even the LED array is randomly placed under the sample with both unknown lateral offsets and rotations. As such, it enables the development of robust FPM systems by reducing the requirements on fine mechanical adjustment and data-driven correction in the construction process.

radiology, nuclear medicine & medical imaging,biochemical research methods,optics
Single full-FOV reconstruction Fourier ptychographic microscopy

Youqiang Zhu,Minglu Sun,Xiong Chen,Hao Li,Quanquan Mu,Dayu Li,Li Xuan

DOI: https://doi.org/10.1364/boe.409952

IF: 3.4

2020-11-16

Biomedical Optics Express

Abstract:Fourier ptychographic microscopy (FPM) is a recently developed computational imaging technique that has high-resolution and wide field-of-view (FOV). FPM bypasses the NA limit of the system by stitching a number of variable-illuminated measured images in Fourier space. On the basis of the wide FOV of the low NA objective, the high-resolution image with a wide FOV can be reconstructed through the phase recovery algorithm. However, the high-resolution reconstruction images are affected by the LED array point light source. The results are: (1) the intensities collected by the sample are severely declined when edge LEDs illuminate the sample; (2) the multiple reconstructions are caused by wavevectors inconsistency for the full FOV images. Here, we propose a new lighting scheme termed full FOV Fourier ptychographic microscopy (F3PM). By combining the LED array and telecentric lens, the method can provide plane waves with different angles while maintaining uniform intensity. Benefiting from the telecentric performance and f‒θ property of the telecentric lens, the system stability is improved and the relationship between the position of LED and its illumination angle is simplified. The excellent plane wave provided by the telecentric lens guarantees the same wavevector in the full FOV, and we use this wavevector to reconstruct the full FOV during one time. The area and diameter of the single reconstruction FOV reached 14.6mm 2 and 5.4 mm, respectively, and the diameter is very close to the field number (5.5 mm) of the 4× objective. Compared with the traditional FPM, we have increased the diameter of FOV in a single reconstruction by ∼ 10 times, eliminating the complicated steps of computational redundancy and image stitching.

radiology, nuclear medicine & medical imaging,biochemical research methods,optics
Correction Algorithms of Pupil Aberration for Fourier Ptychographic Microscopy

Minli Chen,Zhaofeng Cen,Xiaotong Li

DOI: https://doi.org/10.1117/12.2501104

2018-01-01

Abstract:Fourier ptychographic microscopy (FPM) is a newly developed imaging approach for achieving wide field and high resolution. However, image quality will degraded by the pupil aberration because of the limitation of geometrical optics. In this paper, two correction algorithms of pupil aberration combining original FPM algorithm with ptychographical iterative engine (PIE) are presented and justified. And the standard coefficients of Zernike polynomial are applied for constructing the pupil aberration in the simulation. Compared to original FPM algorithm, these algorithms add constraints to the sample and the pupil during each iteration, so that the image can be reconstructed and the pupil function can be recovered simultaneously. Furthermore, we illustrate that these algorithms can not only improve robustness, but also have faster convergence under different aberrations.
Development and Assessment of Multiple Illumination Color Fourier Ptychographic Microscopy for High Throughput Sample Digitization

Patrik Gilley,Ke Zhang,Neman Abdoli,Youkabed Sadri,Laura Adhikari,Kar-Ming Fung,Yuchen Qiu

DOI: https://doi.org/10.3390/s24144505

IF: 3.9

2024-07-13

Sensors

Abstract:In this study, we proposed a multiplexed color illumination strategy to improve the data acquisition efficiency of Fourier ptychography microscopy (FPM). Instead of sequentially lighting up one single channel LED, our method turns on multiple white light LEDs for each image acquisition via a color camera. Thus, each raw image contains multiplexed spectral information. An FPM prototype was developed, which was equipped with a 4×/0.13 NA objective lens to achieve a spatial resolution equivalent to that of a 20×/0.4 NA objective lens. Both two- and four-LED illumination patterns were designed and applied during the experiments. A USAF 1951 resolution target was first imaged under these illumination conditions, based on which MTF curves were generated to assess the corresponding imaging performance. Next, H&E tissue samples and analyzable metaphase chromosome cells were used to evaluate the clinical utility of our strategy. The results show that the single and multiplexed (two- or four-LED) illumination results achieved comparable imaging performance on all the three channels of the MTF curves. Meanwhile, the reconstructed tissue or cell images successfully retain the definition of cell nuclei and cytoplasm and can better preserve the cell edges as compared to the results from the conventional microscopes. This study initially validates the feasibility of multiplexed color illumination for the future development of high-throughput FPM scanning systems.

engineering, electrical & electronic,chemistry, analytical,instruments & instrumentation
Microscopic Image Enhancement Based On Fourier Ptychography Technique

Ying Wang,Guocheng Zhou,Yao Hu,Xuemin Cheng,Qun Hao,Shaohui Zhang

DOI: https://doi.org/10.1117/12.2519602

2019-01-01

Abstract:Image enhancement technique is utilized to emphasize the overall or local characteristics of pictures and widely used in aerospace, and machine vision application. However, most of these techniques are mathematical algorithms based on captured pictures instead of the imaging process. Fourier ptychographic microscopy (FPM) is a recently developed computational imaging approach which stitches together low-resolution images acquired under different angles of illumination with the same intensity in Fourier space to produce a wide-field, high-resolution complex sample image. In this article, a theoretical model about the illumination intensity is proposed. The effect of uneven illumination intensity can be reduced significantly based on our model. Furthermore, the quality of the reconstructed image can be enhanced by adjusting the intensity of the illumination light corresponding to the high frequency components of the original spectrum.
Analysis of Fourier ptychographic microscopy with half of the captured images

Ao Zhou,Ni Chen,Haichao Wang,Guohai Situ

DOI: https://doi.org/10.1088/2040-8986/aad453

IF: 2.1

2018-07-31

Journal of Optics

Abstract:Fourier ptychographic microscopy (FPM) is a new computational imaging technique that can provide gigapixel images with both a high resolution and a wide field of view. However, the data-acquisition process is time consuming, which is a critical issue. In this study, we analyze the FPM imaging system with the half number of captured images; i.e., if the size of the light-emitting diode (LED) array is 15× 15, we use 15×8 LEDs to capture images. According to the image analysis of the conventional FPM system, we then compare the reconstructed images with different captured data. When the sample is close to amplitude-only, simulation and experimental results show that the resolution of the reconstructed image with the half number of captured data does not differ significantly from that with all the captured data.

optics
Hyperuniform illumination subsampling method for Fourier ptychographic microscopy

Ying-Hui Ni,Si-Yuan Fan,Shu-Yuan Zhang,Ming-Jie Sun

DOI: https://doi.org/10.1016/j.optlaseng.2024.108106

IF: 5.666

2024-02-10

Optics and Lasers in Engineering

Abstract:Fourier ptychographic microscopy (FPM) is a novel computational microscopy technique, where Angular-varying LED illumination and phase retrieval techniques are used to stitch a wide field-of-view (FOV) and high-resolution (HR) image. However, the imaging process of FPM needs long acquisition and reconstruction time, which limits the application of FPM in dynamic imaging. Here, we propose a hyperuniform illumination subsampling method to generate 2D hyperuniform LED illumination patterns with grid and collision distance constraints, termed HUD-FPM, to improve FPM imaging efficiency. The corresponding LED element can be lighted up in sequence, and the low-resolution (LR) images can be captured and reconstructed. We verify the effectiveness of the proposed method through simulations and experiments. The proposed method can achieve reconstruction quality close to tranditional sampling FPM while reducing the number of image captures by about 67.2%. Images reconstructed through hyperuniform illumination mode have lower root mean square error and exhibit finer details than commonly used sparse sampling methods at high frequencies. Further, the same conclusion can be also applied to the non-uniform and high-NA quasi-dome LED illuminator design.

optics

Advanced Illumination Pattern in Fourier Ptychographic Microscopy

Structured Illumination Fluorescence Fourier Ptychographic Microscopy

Digital micromirror device-based laser-illumination Fourier ptychographic microscopy.

Effect of spatial spectrum overlap on fourier ptychographic microscopy

Pattern-illuminated Fourier Ptychography Microscopy with a Pattern-Estimation Algorithm.

Surface wave illumination Fourier ptychographic microscopy.

Tunable-illumination for Laser Fourier Ptychographic Microscopy Based on a Background Noise-Reducing System

Saturated Pattern-Illuminated Fourier Ptychography Microscopy

Phase-coded Speckle Illumination for Laser Fourier Ptychographic Microscopy

Adaptive Selection of Illumination Based on 3d Fourier Ptychography

Wavefront Modulation with Spatial Light Modulator for Fourier Ptychographic Microscopy

High-Resolution Dmd-Fpm System Based On Ring Pattern Phase Retrieval Algorithm

A Positional Misalignment Correction Method for Fourier Ptychographic Microscopy Based on the Quasi-Newton Method with a Global Optimization Module

Illumination Pattern Design with Deep Learning for Single-Shot Fourier Ptychographic Microscopy

Robust Fourier ptychographic microscopy via a physics-based defocusing strategy for calibrating angle-varied LED illumination

Single full-FOV reconstruction Fourier ptychographic microscopy

Correction Algorithms of Pupil Aberration for Fourier Ptychographic Microscopy

Development and Assessment of Multiple Illumination Color Fourier Ptychographic Microscopy for High Throughput Sample Digitization

Microscopic Image Enhancement Based On Fourier Ptychography Technique

Analysis of Fourier ptychographic microscopy with half of the captured images

Hyperuniform illumination subsampling method for Fourier ptychographic microscopy