Single-Crystalline Monolayer Mos2 Arrays Based High-Performance Transistors Via Selective-Area CVD Growth Directly on Silicon Wafers

Guixu Zhu,Xiaodong Zhang,Haotian Fang,Dongdong Sun,Luyang Wang,Zujian Dai,Lizi Wei,Qiuyang Lin,Ao Li,Yufeng Min,Qiuxia Lu,Lixin He,Dongsheng Song,Yuanyuan Shi
DOI: https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631381
2024-01-01
Abstract:Here we present a method that fabricates massive arrays of single-crystalline monolayer (ML) $\text{MoS}_{2}$ -based transistors directly on silicon wafers without a 2D-layer transfer process (2D-LTP). Inspired by epitaxial growth, quasi-terrace $\mathrm{A}1_{2}\mathrm{O}_{3}$ triangle-arrays are designed on silicon wafers, facilitating selective-area growth (SAG) of single-crystalline ML $\text{MoS}_{2}$ arrays. The SAG $\text{MoS}_{2}$ arrays based back-gate (BG) transistors show a maximum mobility of $62.8 \ \text{cm}^{2}\mathrm{V}\mathrm{s}$ and $1_{\mathrm{o}\mathrm{n}}/\mathrm{I}_{\mathrm{o}\mathrm{f}\mathrm{f}}$ ratio of $2.5\times 10^{8}$ . The study paves the way for high throughput, Si-compatible, transfer-free, and controllable integration of single-crystalline transition metal dichalcogenides (TMDs) based transistors.
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