Abstract:In the design and manufacturing of epoxy resin insulation components, complex structures can be achieved through multiple pours, thereby forming the structure of interface of laminated epoxy resin. This type of interface structure is often considered a weak link in performance which can easily accumulate charges and cause electric field distortion. However, research on the interlayer interface of epoxy resin has received little attention. In this study, epoxy samples with and without interlayer interfaces were prepared, and the space charge accumulation characteristics and trap characteristics of the samples were analyzed via pulsed electro-acoustic (PEA) and thermally stimulated depolarization current (TSDC) methods. The experimental results indicate that the Maxwell–Wagner interface polarization model cannot fully explain the charge accumulation at the interface. Due to the influence of the secondary curing, the functional groups in the post-curing epoxy resin can move and react with the partially reacted functional groups in the prefabricated epoxy resin layer, resulting in a weak cross-linking network at the interface. With the increase in temperature, the molecular chain segments in the weak cross-linked region of the interface become more active and introduce deep traps at the interface, thereby exacerbating the accumulation of interface charges. In addition, due to the influence of interface polarization and weak cross-linking, the ability of the interface charges to cause field strength distortions decreases with the increase in applied field strength. This research study can provide a theoretical reference for the interfacial space charge transport characteristics of epoxy-cured cross-linked layers and provide ideas for regulating interfacial cross-linking to suppress interfacial charge accumulation.

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