Abstract:Tip-enhanced Raman spectroscopy (TERS) has recently been developed to push the spatial resolution down to single-chemical-bond scale. The morphology of the scanning tip, especially the atomistic protrusion at the tip apex, plays an essential role in obtaining both high spatial resolution and large field enhancement at the Ångström level. Although it is very difficult to directly characterize the atomistic structures of the tip, the Raman scattering from the apex's own vibrations of the metal tip can provide valuable information about the stacking of atoms at the tip apex. However, conventional quantum chemistry packages can only simulate the Raman scattering of small metal clusters with few atoms due to huge computational cost, which is not enough since the shaft of the tip behind the apex also makes significant contributions to the polarizabilities of the whole tip. Here we propose an atomistic polarization model to simulate the Raman spectra of large metal tips at subwavelength scales based on the combination of the atomistic discrete dipole approximation model and the density functional theory. The atomistic tip with different sizes and stacking structures is considered in its entirety during the calculation of polarizabilities, and only the vibrational contributions from the tip apex are taken into account to simulate the Raman spectra of the tip. The Raman spectral features are found to be very sensitive to the local constituent element at the tip apex, atomic stacking modes, and shape of the tip apex, which can thus be used as a fingerprint to identify different atomistic structures of the tip apex. Moreover, our approaches can be extended to the metal tips with sub-wavelength sizes, making it possible to consider both the large scale and the atomistic detail of the tip simultaneously. The method presented here can be used as a basic tool to simulate the Raman scattering process of the metal tips and other nanostructures in an economic way, which is beneficial for understanding the roles of atomistic structures in tip- and surface-enhanced spectroscopies.

Simulation of Tip Parameters Influence on Electron Emission in SPEES

Simulation Study of Auger Electron Emission Features in Tip–Sample Electric Field Region for Scanning Probe Electron Energy Spectrometer

A Simulation Study on the Flash X-Ray Spectra Spatial Distribution

Note: Microelectrode-shielding Tip for Scanning Probe Electron Energy Spectroscopy.

The Control System of the Scanning Probe Electron Energy Spectrometer

Note: Electron Energy Spectroscopy Mapping of Surface with Scanning Tunneling Microscope.

Surface plasmon excitation of Au in scanning probe electron energy spectroscopy

Nanoscale Spectroscopic Mapping by Scanning Probe Electron Energy Spectroscopy

Theoretical and Experimental Studies of N(E) Spectra in Auger Electron Spectroscopy

Theoretical Analysis and Simulation of the Influence of Self-Bunching Effects and Longitudinal Space Charge Effects on the Propagation of Kev Electron Bunch Produced by A Novel S-Band Micro-Pulse Electron Gun

Fabrication of Co-Axial Field Emitter Tips for Scanning Probe Energy Loss Spectroscopy

Efficient Method for Fast Simulation of Scanning Tunneling Microscopy with A Tip Effect

Computer Simulation of Double-gated Field Emission Cathode

Characterization of an Electron Emitting Tip by Field Emission Microscope and Scanning Probe Microscope

Simulation of Heterogeneous Atom Probe Tip Shapes Evolution during Field Evaporation Using a Level Set Method and Different Evaporation Models

Scanning Probe Energy Loss Spectroscopy with Microfabricated Coaxial Tips

Theoretical Modeling for UV Photoelectron Emission Yield of Spacecraft Surface Materials

Theoretical Model Development and Experimental Test Application for Ultraviolet Photoelectron Emission Yield of Spacecraft Surface Materials

Improved Calculation of the Backscattering Factor for Quantitative Analysis by Auger Electron Spectroscopy

Atomistic Polarization Model for Raman Scattering Simulations of Large Metal Tips with Atomic-Scale Protrusions at the Tip Apex

Simulation Method for Investigating the Use of Transition-Edge Sensors as Spectroscopic Electron Detectors