Abstract:The compositionally graded Ba1−xCaxZr0.05Ti0.95O3 (x = 0, 0.05, 0.10) (BCZT) thin films with compositional gradient from BaZr0.05Ti0.95O3 to Ba0.90Ca0.10Zr0.05Ti0.95O3 were deposited on Pt/Ti/SiO2/Si substrates by sol-gel processing. The crystal structure of the thin films was determined by X-ray diffraction. Field emission scanning electron microscopy (FESEM) was used to examine crystallite size and morphology of compositionally graded thin films. The dielectric properties of compositionally graded thin films were characterized by measuring the dielectric constant and dielectric loss as a function of temperature, applied electric field and frequency. As a result, compositionally graded thin films with weak temperature dependence were realized. Dielectric constant peaks, common to a ferroelectric transition, were not observed in the temperature range from 298 to 413 K. The compositionally graded BCZT thin films with weak temperature dependence of tunability could be attractive materials for frequency and phase agile tunable microwave components such as tunable filters, tunable oscillators, and phase shifters for application in phased array antennas.

PREPARATION AND DIELECTRIC PROPERTIES OF Ba(ZrxTi1−x)O3 THIN FILMS GROWN BY A SOL-GEL PROCESS

Dielectric and Ferroelectric Properties of Ba(Zr0.35Ti0.65)O3 Thin Films Grown by a Sol-Gel Process

Orientation Control and Dielectric Properties of Sol–gel Deposited Ba (ti, Zr)O3 Thin Films

Structural and Dielectric Properties of Ba0.85Sr0.15(Zr0.18Ti0.85)O3 Thin Films Grown by a Sol–gel Process

Enhanced dielectric tunability properties of Ba(ZrxTi1-x)O3 thin films using seed layers on Pt/Ti/SiO2/Si substrates

Effect of Seed Layers on Dielectric Properties of Ba(Zr 0.3 Ti 0.7 )O 3 Thin Films

DIELECTRIC PROPERTIES OF COMPOSITIONALLY GRADED BA0.90SR0.10ZRXTI1-XO3 THIN FILMS PREPARED BY THE SOL-GEL TECHNIQUE

Structural And Dielectric Properties Of Ba(Zrxti1-X)O-3 Thin Films Prepared By The Sol-Gel Process

Dielectric, Ferroelectric and Optical Properties of BaZr 0.2 Ti 0.8 O 3 Thin Films Prepared by Sol–gel-Hydrothermal Process

The Microstructure Characteristics and Dielectric Properties of (Ba,sr)(sn,ti)o-3 Thin Films Grown by A Sol-Gel Process

Study of Dielectric Characteristics of Graded Ba 1−x Ca X Zr 0.05 Ti 0.95 O 3 Thin Films Grown by a Sol-Gel Process

Low Dielectric Loss and Enhanced Tunability of Ba(Zr0.3Ti0.7)O3-based Thin Film by Sol–gel Method

Structure, dielectric, ferroelectric, and optical properties of (1 - X)Ba(Zr 0.2Ti 0.8)O 3 - X(Ba 0.7Ca 0.3)TiO 3 thin films prepared by sol-gel method

Structure and Dielectric Tunability of (pb0.5ba0.5)zro3 Thin Films Derived on (sr0.95la0.05)tio3 Buffer-Layered Substrates

STRUCTURE AND PROPERTIES OF Ba(Zr_(0.3)Ti_(0.7))O_3 THIN FILMS

Dielectric Properties of Heterostructured BZT Thin Films Prepared by Sol–gel Technique

Effects of buffer layers on the orientation and dielectric properties of Ba(Zr0.20Ti0.80)O3 thin films prepared by sol–gel method

Enhanced dielectric property from highly (100)-oriented barium zirconate titanate compositional gradient films

Structure-related Infrared Optical Properties of Ba(ZrxTi1−x)O3 Thin Films Grown on Pt/Ti/SiO2/Si Substrates by Low-Temperature Processing

Effects of CeO2 buffer layer thickness on the orientation and dielectric properties of Ba(Zr0.20Ti0.80)O3 thin films

MgTiO<sub>3</sub>and Ba<sub>0.60</sub>Sr<sub>0.40</sub>Mg<sub>0.15</sub>Ti<sub>0.85</sub>O<sub>3</sub>Composite Thin Films with Promising Dielectric Properties for Tunable Applications