Abstract:CeO2 film plays an essential role in nucleation and growth of YBa2Cu3O7−x (YBCO) films. In this work, the dependence of superconducting properties of YBCO on CeO2 films with different thicknesses was investigated, in order to achieve fabrication of high-performance YBCO coated conductors in industrial scale. The crystalline structure and morphology of CeO2 films with thickness ranging from 21 to 563 nm were systematically characterized by means of X-ray diffraction (XRD), atomic force microscope (AFM) and reflection high-energy electron diffraction (RHEED). Additional focus was addressed on evolution of the surface quality of CeO2 films with thickness increasing. The results show that at the optimal thickness of 221 nm, CeO2 film exhibits sharp in-plane and out-of-plane texture with full width of half maximum (FWHM) values of 5.9° and 1.8°, respectively, and smooth surface with a mean root-mean-square (RMS) roughness value as low as 0.6 nm. Combing RHEED and transmission electron microscope (TEM) cross-sectional analysis, it is found that nucleation and growth of CeO2 films at early stage remain in island growth mode with rougher surface, while further increasing the thickness beyond the optimal thickness leads to weak surface quality, consequently resulting in degradation of superconductor layers deposited subsequently. Eventually, a critical current density (J c) as high as 4.6 × 106 A·cm−2 (77 K, self-field) is achieved on a YBCO film on a thickness-modulated CeO2/MgO/Y2O3/Al2O3/C276 architecture, demonstrating the advantages of CeO2 films as buffer layer in high-throughput manufacture of coated conductors.

Effect of the Thickness of CeO$_2$ Buffer Layer on the YBCO Coated Conductor

Dependence of Microstructure and J C of YBCO Films on CeO 2 Cap Layers Deposited by Multi-plume PLD

Preparation and Characterization of Ceo2/Ysz/Ceo2 Buffer Layers for Ybco Coated Conductors

Effect of CeO 2 Cap Layers on the Preparation of YBCO Films on Rolling-Assisted Biaxially Textured Substrates by Pulsed Laser Deposition

Thickness Modulation Effect of CeO2 Layer for YBCO Films Grown by Pulsed Laser Deposition

Influence of CeO<sub>2</sub>-Cap Layer on the Texture and Critical Current Density of YBCO Film

Single Cerium Zirconate Buffer Layer on Biaxially Textured Metal Substrates for High Performance Coated Conductors

Microstructure Analysis of High-Quality Buffer Layers on Textured Niw Tapes for Ybco Coated Conductors

Influence of CeO 2 -Cap Layer on the Texture and Critical Current Density of YBCO Film

Uniformity of Long-Length Double-Sided CeO_2 Buffer Layer for YBa_2Cu_3O_(7-δ) Coated Conductors

Improved Textured La2Zr2O7 Buffer Layers on Bi-Axially Textured Ni–W Substrates Using CeO2 Seed Layers for YBa2Cu3O7−x Coated Conductors

Fabrication of YBCO Coated Conductors on Biaxial Textured Metal Substrate by All-Sputtering

Simultaneous double-sided deposition of long-length epitaxial CeO 2 buffer layers for YBCO coated conductors

Thickness Effect of Gd2Zr2O7 Buffer Layer on Performance of YBa2Cu3O7−δ Coated Conductors

Rapid Deposition of Buffer Layers for YBCO Coated Conductors on Biaxially-Textured Ni Tapes

Reel-To-Reel Continuous Deposition Of Ce(X)Zr(1-X)O(2) Single Buffer Layer For Ybco Coated Conductors

Influence of Buffer Layer Surface Morphology on YBCO Critical Current Density Deposited on NiW Tapes

YBCO Coated Conductor with a Single Buffer Layer of Yttrium Oxide

Reel-To-Reel Deposition of Epitaxial Double-Sided Y2o3 Buffer Layers for Coated Conductors

Effects of YSZ Buffer Layer Surface Morphology on Superconducting Performance of YBCO Films Deposited by Pulsed Laser Deposition on NiW Tapes

Surface Morphology of Cerium Oxide Layer and Its Effect on the Performance of Superconducting Layer