Temperature Dependence of Surface Features for CeO2 Cap Layers in Coated Conductors
SHI Xiaoliang,GUO Yanqun,FAN Feng,LIU Zhiyong,BAI Chuanyi,LU Yuming,TAO Bowan,CAI Chuanbing
DOI: https://doi.org/10.13380/j.cnki.chin.j.lowtemp.phys.2016.06.003
2016-01-01
Abstract:As the top layer of multi-layer textured template for coated conductors,the surface features,such as surface morphology,grain size,surface roughness,flatness and density,of the cap layer will directly affect the subsequent nucleation,texture formation and epitaxial growth of YBa2 Cu3 O7 δ superconducting layer.Recently,much attention has been paid to the optimizations of surface features for the buffer layer of coated conductors.CeO2 thin films,as cap layer for coated conductors,were epitaxially deposited on the substrate of LaMnO3/Epi-MgO/ IBAD-MgO/Y2 O3/Al2 O3/Hastelloy C276 continuously by magnetron sputtering.The texture,micro structure,surface morphology,surface roughness and flatness of CeO2 thin films were characterized by X-ray diffraction (XRD),scanning electron microscope (SEM),atomic force microscope (AFM) and Raman spectrometer.The results show that:the surface characteristics of CeO2 thin film are strongly dependent on the deposition temperature,and at an optimized deposition temperature of about 800℃,the prepared CeO2 film achieves perfect (00l) orientation and the best degree of in-plane alignment with (111) phi-scan full width at half maximum around 7.1°,accompanied by a nearly optimum grain size for the highest nucleation density of YBa2 Cu3 O7-a In addition,a flat,uniform,smooth and dense surface with the root mean square (RMS) roughness of about 1.4nm is obtained.Moreover,the YBa2 Cu3 O7-δ superconducting layer epitaxially grown on this CeO2 film by trifluoroacetate metal organic deposition (TFA-MOD) exhibits a good biaxial texture and a dense,uniform surface.