Simplified Finite Element Model for Thermal Residual Stress in Multilayer Ceramic Capacitors

Wu-Gui Jiang
2011-01-01
Abstract:The failure mechanisms of multilayer ceramic capacitors(MLCC) due to thermal residual stress were analyzed by using elastic-plastic finite element(FE) method.A simplified FE model was proposed to take into account the effect of multilayer structure,which can avoid the multilayer structure design and reduce the computational cost.The results obtained from this simplified FE show that there exists a critical thickness ratio of the electrode layer to the dielectric layer in MLCC,below and above which the change trends of the residual stress are opposite.Meanwhile,a fracture mechanics analysis has also been conducted,and the simulation results show the interfacial cracks are more likely to initiate and propagate at the tip end of the inner electrodes.
What problem does this paper attempt to address?