High Resolution Soft X-Ray Spectrometer: Description and Performance

Jianwu Chen,Yongmin Shi,Xing Han,Jianfu Zhang,Yongqiang Shi,Fuchang Zuo,Zhiwu Mei,Zhengxin Lv,Xuli Liu,Yanan Mo,Zhijun Tu,Ran Zheng,Li Wang,Duzhou Zhang

DOI: https://doi.org/10.1117/12.3007837

2023-01-01

Abstract:Silicon drift detector is widely used as X-ray spectrometer sensor. The advantage of this sensor is the ability to get the precise timing and high resolution spectrum. The dark current of the SDD was suppressed by the thermometric cooler, which cooling the detector to a nominal temperature of -52°C. The electronic circuits were made of two assemblies: the focal plane assembly and the Main Electronics Box. The outputs from the FPA were filtered by the fast and slow shaping amplifiers. Both shaping amplifiers were designed basing on a two stage Sallen-Key filters. The fast shaping amplifier, with 185 ns peaking time, was designed to get a better timing accuracy. The slow shaping amplifier, with 1.68 μs peaking timing, provided better energy resolution, along with the pile-up rejection circuits. A non-delay line constant fraction discriminator was adopted to acquire an accurate arrival time. The photon time-tag error mainly comes from two parts: time triggering and time stamping, which are 65.25 ns and 40 ns respectively. Thus the time jitter was 76.53 ns totally. The photon height was hold by the peak sample holder. The conversion relationship between the voltage and line energy was calibrated. The energy resolution was calculated from the Gaussian fitting. The fit to these values produced electronic noise of 11.38 electrons with 95% confidence level. The soft X-Ray spectrometer, as shown above, was capable of providing precise time resolution in conjunction with excellent energy resolution performance.