High-resolution soft X-ray emission spectrograph at advanced light source

Yi-De Chuang,John Pepper,Wayne McKinney,Zahid Hussain,Eric Gullikson,Phil Batson,Dong Qian,M. Zahid Hasan
DOI: https://doi.org/10.1016/j.jpcs.2005.09.051
IF: 4.383
2005-01-01
Journal of Physics and Chemistry of Solids
Abstract:The progress of valence electronic spectroscopy with X-rays has been largely limited by the challenge of fine instrumentation. Relatively weak scattering cross-section and/or limited (coarse) energy resolution restrict X-ray spectroscopy to address fundamental issues in condensed-matter electron physics. Depending on the nature of excitations, high brightness photon beam from third-generation synchrotron facilities helps raise the count rates to a detectable limit over the noise level. Over the past decade, it has been realized that high-resolution resonant inelastic soft X-ray scattering has the potential to play an important role in understanding complex phenomena observed in highly correlated systems. Driven by such demand, we have developed a soft X-ray emission spectrograph based on variable line spacing (VLS) gratings to work in the soft X-ray and deep UV (the M edge of transition metals) regime. The slit-less design coupled with high quality optical elements and a high quantum efficiency (QE) in-vacuum CCD detector greatly improves the overall throughput. The M edge spectrograph has been demonstrated to have a resolving power better than 10,000 and will be used in conjunction with meV-resolution beamline (MERLIN) at the Advanced Light Source at Lawrence Berkeley National Laboratory.
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