Hard X-ray Spectrographs with Resolution Beyond 100 micro-eV

Yuri Shvyd'ko,Stanislav Stoupin,Kiran Mundboth,Jungho Kim

DOI: https://doi.org/10.1103/PhysRevA.87.043835

2012-10-24

Abstract:Spectrographs take snapshots of photon spectra with array detectors by dispersing photons of different energies into distinct directions and spacial locations. Spectrographs require optics with a large angular dispersion rate as the key component. In visible light optics diffraction gratings are used for this purpose. In the hard x-ray regime, achieving large dispersion rates is a challenge. Here we show that multi-crystal, multi-Bragg-reflection arrangements feature cumulative angular dispersion rates almost two orders of magnitude larger than those attainable with a single Bragg reflection. As a result, the multi-crystal arrangements become potential dispersing elements of hard x-ray spectrographs. The hard x-ray spectrograph principles are demonstrated by imaging a spectrum of photons with a record high resolution of $\Delta E \simeq 90 \mu$eV in hard x-ray regime, using multi-crystal optics as dispersing element. The spectrographs can boost research using inelastic ultra-high-resolution x-ray spectroscopies with synchrotrons and seeded XFELs.

Optics,Instrumentation and Detectors