Abstract:High spatial resolution is the goal of many imaging systems. While designing a high-resolution lens with diffraction-limited performance over a large field of view remains a difficult task, creating a complex speckle pattern with wavelength-limited spatial features is easily accomplished with a simple random diffuser. With this observation and the concept of near-field ptychography, we report a new imaging modality, termed near-field Fourier ptychography, to address high-resolution imaging challenges in both microscopic and macroscopic imaging settings. 'Near-field' refers to placing the object at a short defocus distance with a large Fresnel number. We project a speckle pattern with fine spatial features on the object instead of directly resolving the spatial features via a high-resolution lens. We then translate the object (or speckle) to different positions and acquire the corresponding images by using a low-resolution lens. A ptychographic phase retrieval process is used to recover the complex object, the unknown speckle pattern, and the coherent transfer function at the same time. In a microscopic imaging setup, we use a 0.12 numerical aperture (NA) lens to achieve an NA of 0.85 in the reconstruction process. In a macroscale photographic imaging setup, we achieve ~7-fold resolution gain by using a photographic lens. The collection optics do not determine the final achievable resolution; rather, the speckle pattern's feature size does. This is similar to our recent demonstration in fluorescence imaging settings (Guo et al., Biomed. Opt. Express, 9(1), 2018). The reported imaging modality can be employed in light, coherent X-ray, and transmission electron imaging systems to increase resolution and provide quantitative absorption and object phase contrast.

Hard x-ray scanning microscopy with coherent radiation: Beyond the resolution of conventional x-ray microscopes

Surface wave illumination Fourier ptychographic microscopy.

High-Resolution Scanning X-ray Diffraction Microscopy

Single-shot X-ray ptychography as a structured illumination method

Lab-scale soft x-ray ptychography: advanced nanoscale imaging and beam diagnostics

Electronvolt energy resolution with broadband ptychography

Hard X-ray grazing incidence ptychography: Large field-of-view nanostructure imaging with ultra-high surface sensitivity

X-ray multibeam ptychography at up to 20 keV: nano-lithography enhances X-ray nano-imaging

Fast X-ray ptychography: towards nanoscale imaging of large volume of brain

X‐Ray Multibeam Ptychography at up to 20 keV: Nano‐Lithography Enhances X‐Ray Nano‐Imaging

Ultrahigh 22 nm resolution coherent diffractive imaging using a desktop 13 nm high harmonic source.

Hard x-ray grazing-incidence ptychography: large field-of-view nanostructure imaging with ultra-high surface sensitivity

High-speed Three-dimensional Imaging at the Nanoscale Via Fly-scan Ptycho-tomography

25-Fold Resolution Enhancement of X-ray Microscopy Using Multipixel Ghost Imaging

Near-field Fourier Ptychography: Super-Resolution Phase Retrieval Via Speckle Illumination.

Hard X-ray Spectrographs with Resolution Beyond 100 micro-eV

A high-performance reconstruction method for partially coherent ptychography

Coherent x-ray magnetic imaging with 5 nm resolution

Three-dimensional Hard X-ray Ptychographic Reflectometry Imaging on Extended Mesoscopic Surface Structures

Electron ptychography of 2D materials to deep sub-ångström resolution

Broadband ptychographic imaging of biological samples using a deconvolution algorithm