Abstract:In the present work, the (Bi1-xCex)VO4 (x <= 0.6) ceramics were prepared via a solid-state reaction method and all the ceramic samples could be densified below 900 degrees C. From the X-ray diffraction analysis, it is found that a monoclinic scheelite solid solution can be formed in the range x <= 0.10. In the range 0.20 <= x <= 0.60, a composite region with both monoclinic scheelite and tetragonal zircon solid solutions was formed and the content of the zircon phase increased with the calcined or sintering temperature. The refined lattice parameters of (Bi0.9Ce0.1)VO4 are a = 5.1801(0) angstrom, b = 5.0992(1) angstrom, c = 11.6997(8) angstrom, and gamma = 90.346(0)degrees with the space group I1(1)2/b(15). The VO4 tetrahedron contracts with the substitution of Ce for Bi at the A site, and this helps to keep the specific tetrahedron chain stable in the monoclinic structure. The microwave dielectric permittivity was found to decrease linearly from 68 to about 26.6; meanwhile, the quality factor (Q(f)) value increased from 8000 GHz to around 23900 GHz as the x value increased from 0 to 0.60. The best microwave dielectric properties were obtained in a (Bi0.75Ce0.25)VO4 ceramic with a permittivity of similar to 47.9, a Q(f) value of similar to 18000 GHz, and a near-zero temperature coefficient of similar to+15 ppm/degrees C at a resonant frequency of around 7.6 GHz at room temperature. Infrared spectral analysis supported that the dielectric contribution for this system at microwave region could be attributed to the absorptions of structural phonon oscillations. This work presents a novel method to modify the temperature coefficient of BiVO4-type materials. This system of microwave dielectric ceramic might be an interesting candidate for microwave dielectric resonator and low-temperature cofired ceramic technology applications.

Abnormal Dielectric Properties and Phase Transition in Bi₀.₇₈₃(Mo₀.₆₅V₀.₃₅)O₄ Scheelite-Related Structured Ceramic

Abnormal Dielectric Properties and Phase Transition in Bi0.783(Mo0.65V0.35)O4 Scheelite-Related Structured Ceramic

Phase evolution and microwave dielectric properties of xBi(2/3)MoO₄-(1 -x)BiVO₄ (0.0 ≤ x ≤ 1.0) low temperature firing ceramics.

Morphotropic Phase Boundary, Polymorphic Phases and Enhanced Electrostrain/piezoelectricity in Ag1-xKxNbO3 Solid-Solution Ceramics

Crystal structure, impedance and broadband dielectric spectra of ordered scheelite-structured Bi(Sc1/3Mo2/3)O4 ceramic

The Microstructure, Dielectric Abnormalities, Polar Order and Microwave Dielectric Properties of Ag(Nb1−xTax)O3 (x = 0–0.8) Ceramics

Microwave dielectric properties of scheelite structured low temperature fired Bi(In1/3Mo2/3)O4 ceramic

Phase evolution, phase transition, and microwave dielectric properties of scheelite structured xBi(Fe 1/3Mo 2/3)O 4-(1-x) BiVO 4 (0.0 ≤ x ≤ 1.0) low temperature firing ceramics

Crystal Structure And Microwave Dielectric Behaviors Of Ultra-Low-Temperature Fired X(Ag0.5bi0.5)Moo4-(1-X)Bivo4 (0.0 <= X <= 1.0) Solid Solution With Scheelite Structure

Phase transitions and microwave dielectric behaviors of the (Bi1‐xLi0.5xY0.5x)(V1‐xMox)O4 ceramics

Crystal Structure and Microwave Dielectric Behaviors of Scheelite Structured (1-X)bivo4-xla2/3moo4 (0.0 ≤ X ≤ 1.0) Ceramics with Ultra-Low Sintering Temperature

Structural Evolution, Electrical Properties and Electric-Field-induced Changes of (0.8− X )pbtio 3 – X BiFeO 3 –0.2bazro 3 System Near the Morphotropic Phase Boundary

Structure, Phase Evolution, And Microwave Dielectric Properties Of (Ag0.5bi0.5)(Mo0.5w0.5)O-4 Ceramic With Ultra Low Sintering Temperature

Temperature independent low firing [Ca0.25(Nd1-xBix)0.5]MoO4 (0.2 ≤ x ≤ 0.8) microwave dielectric ceramics

Novel Scheelite‐type [ca0.55(nd1‐xbix)0.3]moo4 (0.2 ≤ X ≤ 0.95) Microwave Dielectric Ceramics with Low Sintering Temperature

Influence Of Ce Substitution For Bi In Bivo4 And The Impact On The Phase Evolution And Microwave Dielectric Properties

Microwave Dielectric Properties of Low Firing Temperature Stable Scheelite Structured (Ca,bi)(mo,v)o-4 Solid Solution Ceramics for LTCC Applications

Structure-property relationships of novel microwave dielectric ceramics with low sintering temperatures: (Na(0.5x)Bi(0.5x)Ca(1-x))MoO(4).

Structure-property relationships of low sintering temperature scheelite-structured (1 -x)BiVO4-xLaNbO4 microwave dielectric ceramics

Novel scheelite‐type [Ca 0.55 (Nd 1‐ x Bi x ) 0.3 ]MoO 4 (0.2 ≤ x ≤ 0.95) microwave dielectric ceramics with low sintering temperature

Dielectric behavior, band gap, in situ X-ray diffraction, Raman and infrared study on (1 - X)BiVO4-x(Li0.5Bi 0.5)MoO4 solid solution