Study of the Model of PIN Diode for Conducted EMI Simulation

Yi Yuan,Qian Zhao
IF: 5.967
2001-01-01
IEEE Transactions on Power Electronics
Abstract:A high frequency model of PIN diode for simulating conducted EMI is developed.The model takes into consideration of forward recovery,reverse recovery,emitter recombination and movable bound effect and is completed by MAST in Saber.The comparison between simulation and experiment verifies the model availability.
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