The Modelling of P-I-N Power Diode with Reverse Recovery
Yunqing Pei,Zhao'an Wang,Ise Toshifumi
DOI: https://doi.org/10.3321/j.issn:0253-987X.1999.06.002
1999-01-01
Abstract:A Simple model is presented for a power diode with reverse recovery. The effects of emitter and Auger recombination are involved by considering varied lifetime. Computer aided design software FECS (Power Electronic Circuit Simulation) is used to in improve the accuracy of the result. Simulation are made in many devices to verify the accuracy of the model.
What problem does this paper attempt to address?