Temperature Drift Correction for FPGA-Based Time Measurement Systems

R. Wang,Y. Wang,B. Wu
DOI: https://doi.org/10.1109/nssmicrtsd49126.2023.10338177
2023-01-01
Abstract:A field programmable gate array (FPGA) based time measurement system has been developed for measuring signal arrival time at the picosecond level. However, it has been found that ambient temperature can significantly affect the timing precision of the system. This paper presents an analysis of the temperature effects on each part of the time measurement system, which draws the conclusion that the temperature effect mainly comes from the used switch boxes on the pathway of routing. To understand this temperature effect, the behavior of the switch boxes on their delay time varying with the temperature is investigated, which gives us a simple idea for temperature drift correction. Using single-photon signals from Microchannel Plate Photomultiplier Tubes (MCP-PMTs), the delay temperature coefficients of 128 channels of the system can be easily obtained, which will be used for final temperature-related calibration. After the correction in the temperature range of 35°C to 65°C, the single-photon time resolution of the system is improved from 33-50 ps to 32-37 ps, which demonstrates that the temperature effect in FPGA-based time measurement systems can be almost fully corrected.
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