An Intrinsically PVT Robust 10-Bit 2.6-Gs/s Dynamic Pipelined ADC with Dual-Path Time-Assisted Residue Generation Scheme
Junyan Hao,Minglei Zhang,Zijian Liu,Yanbo Zhang,Shubin Liu,Zhangming Zhu,Yan Zhu,Rui P. Martins,Chi-Hang Chan
DOI: https://doi.org/10.1109/jssc.2024.3507915
IF: 5.4
2024-01-01
IEEE Journal of Solid-State Circuits
Abstract:This article presents a single-channel 10-bit pipelined analog-to-digital converter (ADC) with a dual-path time-assisted residue generation (TARG) technique running at 2.6 GS/s. A voltage-to-time converter (VTC) driving a current-integrating capacitor array through a time pulse facilitates the inter-stage residue amplification, which decouples the constraint between linearity and speed of the residue generation. The time residue path shortens the residue generation period with a lower linearity requirement and quantizes 4 bits simultaneously, speeding up the sub-stage ADC conversion; the voltage residue path achieves a dedicated inter-stage gain with high linearity and relaxed timing, suppressing noise of its subsequent stages. Furthermore, the inherent complementation characteristic of the voltage–time–voltage (V–T–V) conversion in the TARG scheme makes the prototype ADC intrinsically robust to process, voltage, and temperature (PVT) variations. Fabricated in a 28-nm CMOS process, the 2.6-GS/s pipelined ADC achieves a 51.4-dB signal-to-noise and distortion ratio (SNDR) and a 71.0-dB spurious-free dynamic range (SFDR) with a Nyquist input at a 0.9-V power supply, exhibiting a Walden figure-of-merit of 17.6 fJ/conversion-step. The SNDR varies by 1.25 and 1.55 dB across a supply variation of $\pm$ 5% and a temperature range of $-$ 40 $^{\circ}$ C to 85 $^{\circ}$ C, respectively.