Corrections to “film Stress Influence on Nb/Al-AlOx/Nb Josephson Junctions” [aug 19 Article No. 1102105]

Yu Wu,Liliang Ying,Guanqun Li,Xue Zhang,Wei Peng,Jie Ren,Zhen Wang

DOI: https://doi.org/10.1109/tasc.2020.3048886

IF: 1.9489

2021-01-01

IEEE Transactions on Applied Superconductivity

Abstract:Presents changes to author information in the above named paper.

What problem does this paper attempt to address?

Corrections to “zinc Oxide Nanostructures and High Electron Mobility Nanocomposite Thin Film Transistors” [nov 08 3001-3011

Fang‐Ze Li,Gen-Wen Hsieh,S. H. Dalal,Mary Newton,J.E. Stott,Pritesh Hiralal,Arokia Nathan,P. A. Warburton,Hüsnü Emrah Ünalan,Paul Beecher,Andrew J. Flewitt,Ian Robinson,G.A.J. Amaratunga,W. I. Milne

DOI: https://doi.org/10.1109/ted.2008.2010442

2009-01-01

Abstract:In our paper [F.M. Li et al., 2008], two errors were noticed after the paper went to press. On page 3002, near the middle of the left column, it should say "In this method, zinc oxide and carbon powders are mixed together, usually in a ZnO:C ratio of 1: 1 or 1:4 by weight." In Fig. 8, on page 3005, the x-axis label should say "energy (eV)" instead of "wavelength (eV)." Also, this paper should have been designated as Invited, as it is now above.
Corrigendum for “A Novel Kinase Subverts Aluminium Resistance by Boosting Ornithine Decarboxylase‐dependent Putrescine Biosynthesis”

Xiang P. Liu,Li J. Gao,Ben T. She,Gui X. Li,Yun R. Wu,Ji M. Xu,Zhong J. Ding,Jian F. Ma,Shao J. Zheng

DOI: https://doi.org/10.1111/pce.14419

2022-01-01

Abstract:In the published article, the author names in the byline which originally appeared as “Xiang P. Liu, Li J. Gao, Ben T. She, Gui X. Li, Yun R. Wu, Ji M. Xu, Zhong J. Ding, Jian F. Ma, Shao J. Zheng” have been corrected to “Xiangpei Liu, Lijun Gao, Bentao She, Guixin Li, Yunrong Wu, Jiming Xu, Zhongjie Ding, Jianfeng Ma, Shaojian Zheng” in the byline and the ORCID ID section. We apologize for this error.
Correction: Chen et al., Orbital Angular Momentum Generation and Detection by Geometric-Phase Based Metasurfaces. Appl. Sci. 2018, 8, 362

Menglin L. N. Chen,Li Jun Jiang,Wei E. I. Sha

DOI: https://doi.org/10.3390/app8071134

2018-01-01

Abstract:We, the authors, wish to make the following corrections to our paper [...]
Erratum to “critical Influence of Carbon Nitride Self-assembly Coating on the Electrochemical Performance of SnO2-TiO2 Nanocomposite Anode Material for Lithium Ion Battery[Int. J. Electrochem. Sci., 11 (2016) 2461-2472]”

Yangang Wang,Xiang Ding,Lihua Huang,Yangling Xu,Yuanhui Zuo,Shifei Kang,Lifeng Cui

DOI: https://doi.org/10.1016/s1452-3981(23)16178-5

IF: 1.541

2016-01-01

International Journal of Electrochemical Science

Abstract:This is an erratum regarding the published article (Int. J. Electrochem. Sci., 11 (2016) 2461- 2472), which has a mistake in the AUTHORS INFORMATION part.
Corrections to “Low-Temperature Microwave Annealing Processes for Future IC Fabrication—A Review”

Yao-Jen Lee,Ta-Chun Cho,Shang-Shiun Chuang,Fu-Kuo Hsueh,Yu-Lun Lu,Po-Jung Sung,Hsiu-Chih Chen,Michael I. Current,Tseung-Yuen Tseng,Tien-Sheng Chao,Chenming Hu,Fu-Liang Yang

DOI: https://doi.org/10.1109/ted.2023.3272843

IF: 3.1

2023-07-01

IEEE Transactions on Electron Devices

Abstract:The above article [1] presented data on microwave annealing of implanted ions in silicon. There are several typos in the figure captions and labels, and the authors would like to correct them. The text is correct, and the conclusion of [1] is not impacted by these revisions.

engineering, electrical & electronic,physics, applied
Erratum: Corrigendum: Magnetization Reversal by Out-of-plane Voltage in BiFeO3-based Multiferroic Heterostructures

J. J. Wang,J. M. Hu,Ren-Ci Peng,Y. Gao,Y. Shen,L. Q. Chen,C. W. Nan

DOI: https://doi.org/10.1038/srep21443

IF: 4.6

2016-01-01

Scientific Reports

Abstract:Scientific Reports 5: Article number:10459; published online: 21 May 2015; updated: 23 February 2016 This Article contains a typographical error in a grant number in the Acknowledgements section. “This work was supported by the NSF of China (Grant Nos 11234005, 51332001, 51221291, and 51472140), andthe NSF (Grant No: DMR-1410714, DMR-0820404, and DMR-1210588).
Corrections to “A Novel Tunnel FET Design Through Adaptive Bandgap Engineering with Constant Sub-Threshold Slope over 5 Decades of Current and High ${i_{{\mathrm {on}}}}/{i_{{\mathrm {OFF}}}}$ Ratio” [may 17 540-543]

Yang Zhao,Chunlei Wu,Qianqian Huang,Cheng Chen,Jiadi Zhu,Lingyi Guo,Rundong Jia,Zhu Lv,Yuchao Yang,Ming Li,Ru Huang

DOI: https://doi.org/10.1109/led.2018.2810758

IF: 4.8157

2018-01-01

IEEE Electron Device Letters

Abstract:In the above paper, there is an error in the information of corresponding author’s email address. The corrected corresponding author’s email address information is provided.
Correction: Corrigendum: Magnetization Reversal by Out-of-plane Voltage in BiFeO3-based Multiferroic Heterostructures

Wang, J. J.,Hu, J. M.,Peng, Ren-Ci,Gao, Y.,Shen, Y.,Chen, L. Q.,Nan, C. W.

DOI: https://doi.org/10.1038/srep21443

IF: 4.6

2016-01-01

Scientific Reports

Abstract:Scientific Reports 5: Article number:10459; published online: 21 May 2015; updated: 23 February 2016 This Article contains a typographical error in a grant number in the Acknowledgements section. “This work was supported by the NSF of China (Grant Nos 11234005, 51332001, 51221291, and 51472140), andthe NSF (Grant No: DMR-1410714, DMR-0820404, and DMR-1210588).
Corrections to “high Performance Si Nanowire TFTs with Ultrahigh On/Off Current Ratio and Steep Subthreshold Swing” [jan 20 46-49]

Huaxiang Yin,Huafeng Yang,Shuang Xu,Danfeng Pan,Jun Xu,Kunji Chen,Linwei Yu

DOI: https://doi.org/10.1109/led.2020.3016380

IF: 4.8157

2020-01-01

IEEE Electron Device Letters

Abstract:In the referenced article, the corresponding authors should be Danfeng Pan (pdf@nju.edu.cn) and Linwei Yu (yulinwei@nju.edu.cn).
Correction: Enhanced field emission stability of vertically aligned carbon nanotubes through anchoring for X-ray imaging applications

Xinchuan Liu,Yuanxun Li,Jianfeng Xiao,Jiuzhou Zhao,Chi Li,Zhenjun Li

DOI: https://doi.org/10.1039/d3tc90041j

IF: 6.4

2023-03-08

Journal of Materials Chemistry C

Abstract:Correction for 'Enhanced field emission stability of vertically aligned carbon nanotubes through anchoring for X-ray imaging applications' by Xinchuan Liu et al. , J. Mater. Chem. C , 2023, 11 , 2505–2513, https://doi.org/10.1039/d2tc04363g.

materials science, multidisciplinary,physics, applied
Erratum: Zhang, C. et al., The Effect of Substrate Biasing during DC Magnetron Sputtering on the Quality of VO2 Thin Films and Their Insulator–Metal Transition Behavior. Materials 2019, 12, 2160

Chunzi Zhang,Ozan Gunes,Yuanshi Li,Xiaoyu Cui,Masoud Mohammadtaheri,Shi-Jie Wen,Rick Wong,Qiaoqin Yang,Safa Kasap

DOI: https://doi.org/10.3390/ma13225132

IF: 3.4

2020-11-13

Materials

Abstract:The authors would like to correct a typographical error in their paper [...]

materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,metallurgy & metallurgical engineering
Corrigendum to "Effect of Sc contents on the mechanical properties and damping capacity of Al-Zn-Mg-Cu-Zr-Sc alloys with different grain structures" [Heliyon 10(2) January 2024 e24428]

J F Zhou,C Y Liu,K Z He,X X Wei

DOI: https://doi.org/10.1016/j.heliyon.2024.e28814

IF: 3.776

2024-03-30

Heliyon

Abstract:[This corrects the article DOI: 10.1016/j.heliyon.2024.e24428.].
Erratum to “Metal–Insulator Transition of Ge–Sb–Te Superlattice: An Electron Counting Model Study” [Jan 18 140-146]

Nian-Ke Chen,Xian-Bin Li,Xue-Peng Wang,Sheng-Yi Xie,Wei Quan Tian,Shengbai Zhang,Hong-Bo Sun

DOI: https://doi.org/10.1109/TNANO.2018.2823098

2018-01-01

IEEE Transactions on Nanotechnology

Abstract:Presents corrections to the paper, “Metal–insulator transition ofGe–Sb–Te superlattice: An electron counting model study,” (Chen, N.-K.), IEEE Trans. Nanotechnol., vol. 17, no. 1, pp. 140–146, Jan. 2018.
Results of Comprehensive Dose Survey for Mammography

P. Baldelli,J. McCullagh,N. Phelan,F. Flanagan

DOI: https://doi.org/10.1007/978-3-642-13666-5_10

2010-06-16

Abstract:
Correction: Zhou et al. Effect of Zirconium Doping on Electrical Properties of Aluminum Oxide Dielectric Layer by Spin Coating Method with Low Temperature Preparation. Coatings 2020, 10, 620

Yue Zhou,Zhihao Liang,Rihui Yao,Wencai Zuo,Shangxiong Zhou,Zhennan Zhu,Yiping Wang,Tian Qiu,Honglong Ning,Junbiao Peng

DOI: https://doi.org/10.3390/coatings10100918

IF: 3.236

2020-10-21

Coatings

Abstract:The authors wish to make the following corrections to this paper [...]

materials science, multidisciplinary,physics, applied, coatings & films
Correction: Corrigendum: Full 180° Magnetization Reversal with Electric Fields

J. J. Wang,Jia‐Mian Hu,Jianglin Ma,Jianhua Zhang,L. Q. Chen,Ce‐Wen Nan

DOI: https://doi.org/10.1038/srep21444

IF: 4.6

2016-01-01

Scientific Reports

Abstract:Scientific Reports 4: Article number: 7507; published online: 16 December 2014; updated: 25 February 2016. This Article contains a typographical error in a grant number in the Acknowledgements section. “This work was supported by the NSF of China (Grant Nos. 51332001, 11234005, 51472140 and 51221291), and the NSF (Grant No: DMR-1410714, DMR-0820404, and DMR-1210588).
Corrigendum to: Mechanical properties and wear-corrosion resistance of a new compound extrusion process for magnesium alloy AZ61

Jiehui Liu,Hongjun Hu,Yang Liu,Dingfei Zhang,Zhongwen Ou,Yan Zhi

DOI: https://doi.org/10.1515/mt-2023-8002

2023-06-16

Materialpruefung/Materials Testing

Abstract:Corrigendum to: Jiehui Liu, Hongjun Hu, Yang Liu, Dingfei Zhang, Zhongwen Ou and Yan Zhi, "Mechanical properties and wear-corrosion resistance of a new compound extrusion process for magnesium alloy AZ61," Materials Testing , vol. 62, no. 4, pp. 395–399, 2020 (https://doi.org/10.3139/120.111476). As Figures 5a and c have already been published in other articles, the authors wish to replace them by the following figures: Worn surface morphology under load 5 N and reciprocating frequency 2 Hz of magnesium alloy made by a) CE process, b) DE process, c) friction coefficients varying with different loads of dry sliding. The authors would like to apologize for any inconvenience caused. © 2023 Walter de Gruyter GmbH, Berlin/Boston
Corrections to “highly Sensitive Flexible Pressure Sensor by the Integration of Microstructured PDMS Film with A-Igzo TFTs” [jul 18 1073-1076]

Xin Chen,Longlong Chen,Tongkuai Li,Zhihan Zhang,Tingting Zhao,Xifeng Li,Jianhua Zhang

DOI: https://doi.org/10.1109/led.2018.2854438

IF: 4.8157

2018-01-01

IEEE Electron Device Letters

Abstract:In [1] , the name of the first author was transposed and should have read Xin Chen. The authors regret their error.
Erratum to “femtosecond Laser Direct Ablating Micro/Nanostructures and Micropatterns on CH 3 NH 3 PbI 3 Single Crystal” [apr 17 Art. No. 2400110]

Chao-Wei Wang,Yang-Yang Dang,Ya-Hui Su,Jin-Cheng Ni,Chen-Chu Zhang,Jia-Wen Li,Yan-Lei Hu,Jia-Ru Chu,Wen-Hao Huang,Dong Wu,Xu-Tang Tao

DOI: https://doi.org/10.1109/jphot.2019.2910564

IF: 2.4

2019-01-01

IEEE Photonics Journal

Abstract:Presents corrections to the paper, "Femtosecond laser direct ablating micro/nanostructures and micropatterns on CH3NH3PbI3 single crystal" (Wang, C.W., et al), IEEE Photon. J., vol. 9, no. 2, Apr. 2017, Art. no. 2400110.
Erratum: "A Complete Set of Material Properties of Single Domain 0.26Pb(in(12)nb(12))o(3)-0.46Pb(mg(13)nb(23))o(3)-0.28pbtio(3) Single Crystals" [appl. Phys. Lett. 96, 012907 (2010)].

Xiaozhou Liu,Shujun Zhang,Jun Luo,Thomas R Shrout,Wenwu Cao

IF: 4

2010-01-01

Applied Physics Letters

Abstract:[This corrects the article on p. 012907 in vol. 96.].

Corrections to “film Stress Influence on Nb/Al-AlOx/Nb Josephson Junctions” [aug 19 Article No. 1102105]

Corrections to “zinc Oxide Nanostructures and High Electron Mobility Nanocomposite Thin Film Transistors” [nov 08 3001-3011

Corrigendum for “A Novel Kinase Subverts Aluminium Resistance by Boosting Ornithine Decarboxylase‐dependent Putrescine Biosynthesis”

Correction: Chen et al., Orbital Angular Momentum Generation and Detection by Geometric-Phase Based Metasurfaces. Appl. Sci. 2018, 8, 362

Erratum to “critical Influence of Carbon Nitride Self-assembly Coating on the Electrochemical Performance of SnO2-TiO2 Nanocomposite Anode Material for Lithium Ion Battery[Int. J. Electrochem. Sci., 11 (2016) 2461-2472]”

Corrections to “Low-Temperature Microwave Annealing Processes for Future IC Fabrication—A Review”

Erratum: Corrigendum: Magnetization Reversal by Out-of-plane Voltage in BiFeO3-based Multiferroic Heterostructures

Corrections to “A Novel Tunnel FET Design Through Adaptive Bandgap Engineering with Constant Sub-Threshold Slope over 5 Decades of Current and High ${i_{{\mathrm {on}}}}/{i_{{\mathrm {OFF}}}}$ Ratio” [may 17 540-543]

Correction: Corrigendum: Magnetization Reversal by Out-of-plane Voltage in BiFeO3-based Multiferroic Heterostructures

Corrections to “high Performance Si Nanowire TFTs with Ultrahigh On/Off Current Ratio and Steep Subthreshold Swing” [jan 20 46-49]

Correction: Enhanced field emission stability of vertically aligned carbon nanotubes through anchoring for X-ray imaging applications

Erratum: Zhang, C. et al., The Effect of Substrate Biasing during DC Magnetron Sputtering on the Quality of VO2 Thin Films and Their Insulator–Metal Transition Behavior. Materials 2019, 12, 2160

Corrigendum to "Effect of Sc contents on the mechanical properties and damping capacity of Al-Zn-Mg-Cu-Zr-Sc alloys with different grain structures" [Heliyon 10(2) January 2024 e24428]

Erratum to “Metal–Insulator Transition of Ge–Sb–Te Superlattice: An Electron Counting Model Study” [Jan 18 140-146]

Results of Comprehensive Dose Survey for Mammography

Correction: Zhou et al. Effect of Zirconium Doping on Electrical Properties of Aluminum Oxide Dielectric Layer by Spin Coating Method with Low Temperature Preparation. Coatings 2020, 10, 620

Correction: Corrigendum: Full 180° Magnetization Reversal with Electric Fields

Corrigendum to: Mechanical properties and wear-corrosion resistance of a new compound extrusion process for magnesium alloy AZ61

Corrections to “highly Sensitive Flexible Pressure Sensor by the Integration of Microstructured PDMS Film with A-Igzo TFTs” [jul 18 1073-1076]

Erratum to “femtosecond Laser Direct Ablating Micro/Nanostructures and Micropatterns on CH 3 NH 3 PbI 3 Single Crystal” [apr 17 Art. No. 2400110]

Erratum: "A Complete Set of Material Properties of Single Domain 0.26Pb(in(12)nb(12))o(3)-0.46Pb(mg(13)nb(23))o(3)-0.28pbtio(3) Single Crystals" [appl. Phys. Lett. 96, 012907 (2010)].